CAJ | 학술논문

在专用集成电路设计中,基于功能单元的片上系统(FCBSOC,function-core-basedsystem-on-a-chip)设计技术正得到广泛使用.这种片上系统的可测性设计方法很多,如Fscan-Bscan法、Fscan-Tbus法和层次化测试生成法等.通过对这些可测性设计方法的研究,该文提出一种测试开销低、测试故障覆盖率高的层次化分析法来实现专用VAD(Videoadddata)集成电路的可测性设计.
재전용집성전로설계중,기우공능단원적편상계통(FCBSOC,function-core-basedsystem-on-a-chip)설계기술정득도엄범사용.저충편상계통적가측성설계방법흔다,여Fscan-Bscan법、Fscan-Tbus법화층차화측시생성법등.통과대저사가측성설계방법적연구,해문제출일충측시개소저、측시고장복개솔고적층차화분석법래실현전용VAD(Videoadddata)집성전로적가측성설계.
Techniques of function-core-based systems-on-a-chip are currentlyused in ASIC'(application-specific integrated circuits) design. There are many DFT(design for testability) methods for such core-based systems, including mothods of Fscan-Bscan and Fscan-Tbus, and hierarchical test generation, etc. This paper presents a DFT method named HAM (hierarchical-analysis method) for application-specific VAD(video add data) integrated circuit. Low test overhead and the high fault coverage can be achieved by using HAM.