CAJ | 학술논문

本文分析圆柱TE011模端盖对称隙缝特性。在隙缝辐射较小的条件下，提出适于损耗小，厚度薄(1mm左右)的片状材料腔外微扰的近似计算方法，测得聚四氟乙烯、聚氯乙烯、纯陶瓷片等复介电常数与准确值相当吻合的结果。测得相同厚度的片状半导体材料电阻率(≥20Ω·cm)，与1／QL有线性关系，与提出的近似方法所预期结果一致。理论分析和实验表明，应用圆柱TEo11模端盖对称隙缝可实现无接触、高精度、多功能测量片状材料的参数，且预期可用于二维测量。
본문분석원주TE011모단개대칭극봉특성。재극봉복사교소적조건하，제출괄우손모소，후도박(1mm좌우)적편상재료강외미우적근사계산방법，측득취사불을희、취록을희、순도자편등복개전상수여준학치상당문합적결과。측득상동후도적편상반도체재료전조솔(≥20Ω·cm)，여1／QL유선성관계，여제출적근사방법소예기결과일치。이론분석화실험표명，응용원주TEo11모단개대칭극봉가실현무접촉、고정도、다공능측량편상재료적삼수，차예기가용우이유측량。
The characteristics of symmetric slots on the top-cover of TEo11-mode cylindrical cavity are analyzed in this paper. The approximate calculating method is proposed for the low loss and thin flake material perturbation outside of the cavity. The measured complex permittivities of teflon,polyvinyl chloride (PVC) ,pure ceramic flake are in good agreements with the standard data. The linear relation between 1/QL of the cavity and the conductivity of the semiconductor slice material with the same thickness agrees to the anticipation of the approximate calculating method.The theoretical analysis and experimental results show that contactless,high precision,multifunction parameters measurement of flake material are realized by using the slots of port-co-ver. The two-dimensional measurements are also realized by this method