半导体学报
半導體學報
반도체학보
CHINESE JOURNAL OF SEMICONDUCTORS
2006年
6期
994-998
,共5页
闫娜%谈熙%赵涤燹%闵昊
閆娜%談熙%趙滌燹%閔昊
염나%담희%조조선%민호
射频识别%EEPROM%存储器%电荷泵%敏感放大器%低功耗
射頻識彆%EEPROM%存儲器%電荷泵%敏感放大器%低功耗
사빈식별%EEPROM%존저기%전하빙%민감방대기%저공모
radio frequency identification%EEPROM%memory%charge pump%sense amplifier%low power
采用Chartered 0.35μm EEPROM工艺设计并实现了一个适用于无源射频电子标签的256位超低功耗EEPROM存储器.芯片实现了块编程和擦写功能,并通过优化敏感放大器和控制逻辑的结构,实现了读存储器时间和功耗的最优化.最后给出了芯片在编程/擦写/读操作情况下的功耗测试结果.在电源电压为1.8V,数据率为640kHz时,EEPROM编程/擦写的平均功耗约为68μA,读操作平均功耗约为0.6μA.
採用Chartered 0.35μm EEPROM工藝設計併實現瞭一箇適用于無源射頻電子標籤的256位超低功耗EEPROM存儲器.芯片實現瞭塊編程和抆寫功能,併通過優化敏感放大器和控製邏輯的結構,實現瞭讀存儲器時間和功耗的最優化.最後給齣瞭芯片在編程/抆寫/讀操作情況下的功耗測試結果.在電源電壓為1.8V,數據率為640kHz時,EEPROM編程/抆寫的平均功耗約為68μA,讀操作平均功耗約為0.6μA.
채용Chartered 0.35μm EEPROM공예설계병실현료일개괄용우무원사빈전자표첨적256위초저공모EEPROM존저기.심편실현료괴편정화찰사공능,병통과우화민감방대기화공제라집적결구,실현료독존저기시간화공모적최우화.최후급출료심편재편정/찰사/독조작정황하적공모측시결과.재전원전압위1.8V,수거솔위640kHz시,EEPROM편정/찰사적평균공모약위68μA,독조작평균공모약위0.6μA.
An ultra-low-power,256-bit EEPROM is designed and implemented in a Chartered 0.35μm EEPROM process. The read state power consumption is optimized using a new sense amplifier structure and an optimized control circuit. Block programming/erasing is achieved using an improved control circuit. An on silicon program/erase/read access time measurement design is given. For a power supply voltage of 1.8V,an average power consumption of 68 and 0.6μA for the program/erase and read operations,respectively,can be achieved at 640kHz.