清华大学学报（英文版）
清華大學學報（英文版）
청화대학학보（영문판）
TSINGHUA SCIENCE AND TECHNOLOGY
2003年
5期
617-623
,共7页
dielectric randomly rough surface%spectral domain%bi-spectrum method%bistatic scattering coefficients%bi-spectrum scattering model%microwave remote sensing
The bistatic scattering model is offen used for remote microwave sensing. The bi-spectrum model (BSM) for conducting surfaces was used to develop a scattering model for dielectric randomly rough surfaces to estimate their bistatic scattering coefficients. The model for dielectric rough surfaces differs from the BSM for a conducting surface by including Fresnell reflection and transmission from dielectric rough surfaces. The bistatic scattering coefficients were defined to satisfy the reciprocal theorem. Values calculated using the BSM for dielectric randomly rough surfaces compare well with those of the integral equation model (IEM) and with experimental data, showing that the BSM accuracy is acceptable and its range of validity is similar to that of IEM while the BSM expression is simpler than that of IEM.
