物理化学学报
物理化學學報
물이화학학보
ACTA PHYSICO-CHIMICA SINICA
2011年
5期
1232-1238
,共7页
AZO%AZO∶Si%靶-基底距离%射频磁控溅射
AZO%AZO∶Si%靶-基底距離%射頻磁控濺射
AZO%AZO∶Si%파-기저거리%사빈자공천사
AZO%AZO:Si%Substrate-target distance%Radio frequency magnetron sputtering
使用射频磁控溅射,在正方形石英衬底上沉积透明导电掺Al的ZnO(AZO)和Si共掺AZO(AZO∶Si)薄膜.系统研究了靶-基底距离(Dst)和Si共掺对AZO薄膜电学、光学性质的影响.电阻率、载流子浓度和迁移率都强烈地依赖于靶一基底距离,随着靶-基底距离的减少,载流子浓度和迁移率都有显著的增加,电导率也随之提高.在靶-基底距离为4.5 cm处,得到最低电阻率4.94×10-4Ω·cm,此时的载流子浓度和迁移率分别是3.75×1020 cm-3和33.7 cm2· V-1·s-1.X射线光电子能谱(XPS)、X射线衍射(XRD)和边界散射模型被用于分析载流子浓度、迁移率和靶一基底距离的关系.透射谱显示,在可见-近红外范围内所有样品均有大于93%的平均透射率,同时随着靶基距离的减少,吸收边蓝移.AZO:Si表现出可与AZO相比拟的高电导和高透射光学特性,但在热湿环境中却有着更好的电阻稳定性,这在实际使用中很有意义.
使用射頻磁控濺射,在正方形石英襯底上沉積透明導電摻Al的ZnO(AZO)和Si共摻AZO(AZO∶Si)薄膜.繫統研究瞭靶-基底距離(Dst)和Si共摻對AZO薄膜電學、光學性質的影響.電阻率、載流子濃度和遷移率都彊烈地依賴于靶一基底距離,隨著靶-基底距離的減少,載流子濃度和遷移率都有顯著的增加,電導率也隨之提高.在靶-基底距離為4.5 cm處,得到最低電阻率4.94×10-4Ω·cm,此時的載流子濃度和遷移率分彆是3.75×1020 cm-3和33.7 cm2· V-1·s-1.X射線光電子能譜(XPS)、X射線衍射(XRD)和邊界散射模型被用于分析載流子濃度、遷移率和靶一基底距離的關繫.透射譜顯示,在可見-近紅外範圍內所有樣品均有大于93%的平均透射率,同時隨著靶基距離的減少,吸收邊藍移.AZO:Si錶現齣可與AZO相比擬的高電導和高透射光學特性,但在熱濕環境中卻有著更好的電阻穩定性,這在實際使用中很有意義.
사용사빈자공천사,재정방형석영츤저상침적투명도전참Al적ZnO(AZO)화Si공참AZO(AZO∶Si)박막.계통연구료파-기저거리(Dst)화Si공참대AZO박막전학、광학성질적영향.전조솔、재류자농도화천이솔도강렬지의뢰우파일기저거리,수착파-기저거리적감소,재류자농도화천이솔도유현저적증가,전도솔야수지제고.재파-기저거리위4.5 cm처,득도최저전조솔4.94×10-4Ω·cm,차시적재류자농도화천이솔분별시3.75×1020 cm-3화33.7 cm2· V-1·s-1.X사선광전자능보(XPS)、X사선연사(XRD)화변계산사모형피용우분석재류자농도、천이솔화파일기저거리적관계.투사보현시,재가견-근홍외범위내소유양품균유대우93%적평균투사솔,동시수착파기거리적감소,흡수변람이.AZO:Si표현출가여AZO상비의적고전도화고투사광학특성,단재열습배경중각유착경호적전조은정성,저재실제사용중흔유의의.
Transparent conductive Al-doped ZnO(AZO)and Si-codoped AzO(AZO:Si)films were deposited on square quartz substrates by radio frequency(RF)magnetron sputtering.The effect of distance between the substrate and target(Dst)and the effect of co-doping Si on the electricaI and opticaI properties of the AZO films were systematically investigated.The resistivity,carrier concentration,and mobility were found to be strongly dependent on the Dst values.With a decrease in Dst,the carrier concentration and mobility increased significantly,which resulted in improved conductivity.The lowest resistivity of 4.94× 10-4Ω·cm was obtained at a Dst of 4.5 cm,and this was associated with a carrier concentration of 3.75×1020cm-3 and a mobility of 33.7 cm2·V-1·s-1.X-ray photoelectron spectroscopy(XPS),X-ray diffraction(XRD)spectroscopy,and grain boundary scattering models were used to analyze the relationship between the carrier concentration and the mobility at dliferent deposition(Dst)values.Transmittance spectra showed an average transmittance of>93%in the visible-near infrared range for all the samples and a blue shift of the absorption edge with a decrease in Dst.AZO:Si films had high-conductance and high-transmittance optical properties compared with AZO films, and they had better resistivity stability than the AZO films when exposed to a hot and damp atmosphere, which is practically meaningful.