固体电子学研究与进展
固體電子學研究與進展
고체전자학연구여진전
RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS
2001年
1期
57-62
,共6页
刘明%傅东锋%何宇亮%李国华%韩和相
劉明%傅東鋒%何宇亮%李國華%韓和相
류명%부동봉%하우량%리국화%한화상
纳米硅%光致发光%量子限制-发光中心模型
納米硅%光緻髮光%量子限製-髮光中心模型
납미규%광치발광%양자한제-발광중심모형
研究了nc-Si:H薄膜的光致发光(PL),分析了晶粒尺寸、温度对发光特性的影响。对发光样品,晶粒尺寸有一上限,其值在4~5nm之间。在10~77K,nc-Si:H薄膜的发光强度几乎没有变化;当温度高于77K,发光强度指数式下降。随温度升高,发光峰位有少许红移。讨论了nc-Si:H光致发光机理,用量子限制-发光中心模型对实验现象进行了解释。从载流子的激发、复合两方面讨论了发光过程,认为载流子在晶粒内部激发后,弛豫到晶粒界面的发光中心复合发光。
研究瞭nc-Si:H薄膜的光緻髮光(PL),分析瞭晶粒呎吋、溫度對髮光特性的影響。對髮光樣品,晶粒呎吋有一上限,其值在4~5nm之間。在10~77K,nc-Si:H薄膜的髮光彊度幾乎沒有變化;噹溫度高于77K,髮光彊度指數式下降。隨溫度升高,髮光峰位有少許紅移。討論瞭nc-Si:H光緻髮光機理,用量子限製-髮光中心模型對實驗現象進行瞭解釋。從載流子的激髮、複閤兩方麵討論瞭髮光過程,認為載流子在晶粒內部激髮後,弛豫到晶粒界麵的髮光中心複閤髮光。
연구료nc-Si:H박막적광치발광(PL),분석료정립척촌、온도대발광특성적영향。대발광양품,정립척촌유일상한,기치재4~5nm지간。재10~77K,nc-Si:H박막적발광강도궤호몰유변화;당온도고우77K,발광강도지수식하강。수온도승고,발광봉위유소허홍이。토론료nc-Si:H광치발광궤리,용양자한제-발광중심모형대실험현상진행료해석。종재류자적격발、복합량방면토론료발광과정,인위재류자재정립내부격발후,이예도정립계면적발광중심복합발광。
The photoluminescence (PL) properties of nc-Si:H films areinvestigated. The effects of grain size and temperature on PL properties are discussed. There is an upper limit for mean grain size of about 4~5 nm. If the grain size is larger than 5 nm, the visible PL can not be observed from nc-Si:H films. The PL intensity shows no change in the measurement temperature range of 10~77 K, while it decreases exponentially at temperature above 77 K. The PL peaks have a little red shift with temperature increase. The originate of PL from nc-Si:LH films can be explained by quantum confinement effect and luminescence centers (QCE-LCs) model. The electron-hole pairs are excited inside the nano-scale silicon, whose energy will be enlarged to visible range according to QCE. After a series of relaxation, the excited electron-hole pairs then recombine at LCs outside the nano-scale silicon.