压电与声光
壓電與聲光
압전여성광
PIEZOELECTRICS & ACOUSTOOPTICS
2010年
2期
274-276
,共3页
付承菊%黄志雄%李杰%郭冬云
付承菊%黃誌雄%李傑%郭鼕雲
부승국%황지웅%리걸%곽동운
Bi_(3.15)Nd_(0.85)Ti_3O_(12)薄膜%溶胶-凝胶(Sol-Gel)法%铁电性能%介电性能%漏电流
Bi_(3.15)Nd_(0.85)Ti_3O_(12)薄膜%溶膠-凝膠(Sol-Gel)法%鐵電性能%介電性能%漏電流
Bi_(3.15)Nd_(0.85)Ti_3O_(12)박막%용효-응효(Sol-Gel)법%철전성능%개전성능%루전류
Bi_(3.15)Nd_(0.85)Ti_3O_(12) thin film%Sol-Gel method%ferroelectric property%dielectric property%leakage current
采用溶胶-凝胶(Sol-Gel)法在Pt/Ti/SiO_2/Si衬底上制备Bi_(3.15)Nd_(0.85)Ti_3O_(12)薄膜,发现制备的薄膜具有单一的钙钛矿晶格结构,且表面平整致密.对Bi_(3.15)Nd_(0.85)Ti_3O_(12)薄膜的电学性能进行了研究.结果表明,室温下,在测试频率1 MHz时,其介电常数为213,介电损耗为0.085;在测试电压为350 kV/cm,其剩余极化值、矫顽场强分别为39.1 μC/cm~2、160.5 kV/cm;表现出良好的抗疲劳特性和绝缘性能.
採用溶膠-凝膠(Sol-Gel)法在Pt/Ti/SiO_2/Si襯底上製備Bi_(3.15)Nd_(0.85)Ti_3O_(12)薄膜,髮現製備的薄膜具有單一的鈣鈦礦晶格結構,且錶麵平整緻密.對Bi_(3.15)Nd_(0.85)Ti_3O_(12)薄膜的電學性能進行瞭研究.結果錶明,室溫下,在測試頻率1 MHz時,其介電常數為213,介電損耗為0.085;在測試電壓為350 kV/cm,其剩餘極化值、矯頑場彊分彆為39.1 μC/cm~2、160.5 kV/cm;錶現齣良好的抗疲勞特性和絕緣性能.
채용용효-응효(Sol-Gel)법재Pt/Ti/SiO_2/Si츤저상제비Bi_(3.15)Nd_(0.85)Ti_3O_(12)박막,발현제비적박막구유단일적개태광정격결구,차표면평정치밀.대Bi_(3.15)Nd_(0.85)Ti_3O_(12)박막적전학성능진행료연구.결과표명,실온하,재측시빈솔1 MHz시,기개전상수위213,개전손모위0.085;재측시전압위350 kV/cm,기잉여겁화치、교완장강분별위39.1 μC/cm~2、160.5 kV/cm;표현출량호적항피로특성화절연성능.
The Bi_(3.15)Nd_(0.85)Ti_3O_(12) thin films were fabricated on the Pt/Ti/SiO_2/Si substrates by using Sol-Gel method. The thin films showed a perovskite phase and dense microstructure. The electric performance of Bi_(3.15)Nd_(0.85)Ti_3O_(12) thin film was studied. The result showed that he dielectric constant and the dissipation factor were about 213 and 0.085 at 1 MHz at room temperature, respectively. The remnant polarizations (2P_r) and coercive field (2E_c) of the Bi_(3.15)Nd_(0.85)Ti_3O_(12) thin films were 39.1 μC/cm~2 and 160.5 kV/cm, respectively, under an applied field of 350 kV/cm. Also, the films showed fatigue-free and good insulating behavior.