冶金分析
冶金分析
야금분석
METALLURGICAL ANALYSIS
2010年
2期
62-65
,共4页
王振坤%李异%姚传刚%王虹%王昊云%杨丽飞%郭军
王振坤%李異%姚傳剛%王虹%王昊雲%楊麗飛%郭軍
왕진곤%리이%요전강%왕홍%왕호운%양려비%곽군
高碳铬铁%微波消解%电感耦合等离子体原子发射光谱法%硅%磷
高碳鉻鐵%微波消解%電感耦閤等離子體原子髮射光譜法%硅%燐
고탄락철%미파소해%전감우합등리자체원자발사광보법%규%린
high carbon-chrome iron%microwave digestion%inductively coupled plasma atomic emission spectrometry%silicon%phosphorus
以氢氟酸、高氯酸为溶剂,采用微波消解法处理高碳铬铁样品,电感耦合等离子体原子发射光谱仪测定溶液中的硅和磷.实验优化了电感耦合等离子体原子发射光谱仪的工作条件,选择251.612 nm和213.618 nm谱线分别作为硅、磷的分析线.探讨了基体元素铁、铬和溶样酸干扰及校正.结果表明,铁和铬对测定影响不大,采用基体匹配法可消除其干扰;溶样酸的干扰可通过控制样品和校准曲线样品的溶样酸一致来减小或消除.硅和磷的检出限分别为0.001 5%和0.002 1%.对高碳铬铁标准样品和实际样品进行分析,结果同认定值或其他方法(碱熔-ICP-AES法、XRF法)的测定值相一致,相对标准偏差为0.40%~5.3%(n=11).
以氫氟痠、高氯痠為溶劑,採用微波消解法處理高碳鉻鐵樣品,電感耦閤等離子體原子髮射光譜儀測定溶液中的硅和燐.實驗優化瞭電感耦閤等離子體原子髮射光譜儀的工作條件,選擇251.612 nm和213.618 nm譜線分彆作為硅、燐的分析線.探討瞭基體元素鐵、鉻和溶樣痠榦擾及校正.結果錶明,鐵和鉻對測定影響不大,採用基體匹配法可消除其榦擾;溶樣痠的榦擾可通過控製樣品和校準麯線樣品的溶樣痠一緻來減小或消除.硅和燐的檢齣限分彆為0.001 5%和0.002 1%.對高碳鉻鐵標準樣品和實際樣品進行分析,結果同認定值或其他方法(堿鎔-ICP-AES法、XRF法)的測定值相一緻,相對標準偏差為0.40%~5.3%(n=11).
이경불산、고록산위용제,채용미파소해법처리고탄락철양품,전감우합등리자체원자발사광보의측정용액중적규화린.실험우화료전감우합등리자체원자발사광보의적공작조건,선택251.612 nm화213.618 nm보선분별작위규、린적분석선.탐토료기체원소철、락화용양산간우급교정.결과표명,철화락대측정영향불대,채용기체필배법가소제기간우;용양산적간우가통과공제양품화교준곡선양품적용양산일치래감소혹소제.규화린적검출한분별위0.001 5%화0.002 1%.대고탄락철표준양품화실제양품진행분석,결과동인정치혹기타방법(감용-ICP-AES법、XRF법)적측정치상일치,상대표준편차위0.40%~5.3%(n=11).
The high carbon-chrome iron sample was treated by microwave digestion with hydrofluoric acid and perchloric acid as solvent. The content of silicon and phosphorus was then determined by inductively coupled plasma atomic emission spectrometry. The working conditions of inductively coupled plasma atomic emission spectrometer were optimized. In this study, 251. 612 nm and 213. 618 nm were used as the analytical lines of silicon and phosphorus, respectively. The interference and correction of matrix iron, chrome and acids were discussed. The results indicated that iron and chrome had little interference with the determination, which could be eliminated by matrix matching method. The interference of acid could be reduced or eliminated by adding the same amount of acid into sample and standard sample. The detection limits of silicon and phosphorus were 0. 0015 % and 0. 002 1%, re-spectively. The standard sample and actual sample of high carbon-chrome iron were analyzed by this method. The results were consistent with the certified values or those obtained by other methods (alkali fusion ICP-AES method, XRF method). The relative standard deviations (RSD) were in the range of 0.40 %-5.3 % (n=11).