电子元件与材料
電子元件與材料
전자원건여재료
ELECTRONIC COMPONENTS & MATERIALS
2001年
2期
3-4
,共2页
氧化锆膜%电导率%四电极法
氧化鋯膜%電導率%四電極法
양화고막%전도솔%사전겁법
用四电极法测量了自制ZrO2-9% Y2O3电解质薄膜的高温电导率,并研究了其离子导电性能。结果表明,高温下ZrO2薄膜的电导率比块状ZrO2材料大一个数量级,ZrO2薄膜的电导率与温度之间的关系满足Arrhenius方程,符合离子迁移数大于0.99的要求。
用四電極法測量瞭自製ZrO2-9% Y2O3電解質薄膜的高溫電導率,併研究瞭其離子導電性能。結果錶明,高溫下ZrO2薄膜的電導率比塊狀ZrO2材料大一箇數量級,ZrO2薄膜的電導率與溫度之間的關繫滿足Arrhenius方程,符閤離子遷移數大于0.99的要求。
용사전겁법측량료자제ZrO2-9% Y2O3전해질박막적고온전도솔,병연구료기리자도전성능。결과표명,고온하ZrO2박막적전도솔비괴상ZrO2재료대일개수량급,ZrO2박막적전도솔여온도지간적관계만족Arrhenius방정,부합리자천이수대우0.99적요구。
The Conductivity of self-made ZrO2-9mol%Y2O3 electrolyte film is measured at high temperature by four-electrodes method and its ionic conductive properties is studied. The results show that the conductivity of ZrO2 film is one order of magnitude greater than bulk ZrO2 at high temperature. The relationship between conductivity and temperature satisfies the Arrhenius equation. The requirement is reached that ionic transport number greater than 0.99.(5 refs.)