CAJ | 학술논문

在BaFBr:Eu2+中掺入Si4+合成了一种新的X射线影像板材料,其主要光激励发光(PSL)性能,如射线敏感度和长波可激发性都优于低价阳离子掺杂的BaFBr∶Eu2+.用喇曼和顺磁共振(EPR)等手段表征了掺Si4+后BaFBr∶Eu2+中电子陷阱的结构,并根据此结构解释了其激发波长的红移量比其它低价阳离子掺杂都高的原因.
재BaFBr:Eu2+중참입Si4+합성료일충신적X사선영상판재료,기주요광격려발광(PSL)성능,여사선민감도화장파가격발성도우우저개양리자참잡적BaFBr∶Eu2+.용나만화순자공진(EPR)등수단표정료참Si4+후BaFBr∶Eu2+중전자함정적결구,병근거차결구해석료기격발파장적홍이량비기타저개양리자참잡도고적원인.
Samples of BaSiFBr∶Eu2+ were synthesized and their photo-stimulated luminescence(PSL) properties were measured.It was found that this new phosphor is more radiation sensitive and longer wavelength photo-stimulable than BaFBr∶Eu2+ and its lower-valence cation doped derivatives.By using Raman scattering Ba2+ vacancies and Si4+ were characterized.Electron paramagnetic resonance(EPR) was also used to investigate electron traps in the phosphor.At last,the transition of excited state of electrons in the perturbed electron traps was discussed to interpret the red shift of the stimulating spectrum.