电子测试
電子測試
전자측시
ELECTRONIC TEST
2012年
1期
13-18
,共6页
刘勇锋%姚竹亭%顾秀江%王洁%秦新红
劉勇鋒%姚竹亭%顧秀江%王潔%秦新紅
류용봉%요죽정%고수강%왕길%진신홍
嵌入式存储器%内建自修复%内建自测试
嵌入式存儲器%內建自脩複%內建自測試
감입식존저기%내건자수복%내건자측시
Embedded memory%built-in self-repairing%built-in since test
嵌入式存储器在SoC技术中逐渐成为主体设计结构,由于存储器存在成品率的问题,所以在存储器中设计了内建自测试和内建自修复的策略来解决,其中主要是:基于冗余行的修复策略、基于冗余列的修复策略和基于冗余字的修复策略,然而,在存储器中采用一维冗余块修复策略需要增加更多的冗余块,如果采用二维冗余块修复虽然提高了修复率,但是使得其稳定性和可靠性降低了,为此改进了一种基于DWL修复概念的策略,使其不仅保持了DWL结构的低功耗、提高了冗余资源的利用率,而且快速访问的特性,从而提高了存储器的故障修复率。
嵌入式存儲器在SoC技術中逐漸成為主體設計結構,由于存儲器存在成品率的問題,所以在存儲器中設計瞭內建自測試和內建自脩複的策略來解決,其中主要是:基于冗餘行的脩複策略、基于冗餘列的脩複策略和基于冗餘字的脩複策略,然而,在存儲器中採用一維冗餘塊脩複策略需要增加更多的冗餘塊,如果採用二維冗餘塊脩複雖然提高瞭脩複率,但是使得其穩定性和可靠性降低瞭,為此改進瞭一種基于DWL脩複概唸的策略,使其不僅保持瞭DWL結構的低功耗、提高瞭冗餘資源的利用率,而且快速訪問的特性,從而提高瞭存儲器的故障脩複率。
감입식존저기재SoC기술중축점성위주체설계결구,유우존저기존재성품솔적문제,소이재존저기중설계료내건자측시화내건자수복적책략래해결,기중주요시:기우용여행적수복책략、기우용여렬적수복책략화기우용여자적수복책략,연이,재존저기중채용일유용여괴수복책략수요증가경다적용여괴,여과채용이유용여괴수복수연제고료수복솔,단시사득기은정성화가고성강저료,위차개진료일충기우DWL수복개념적책략,사기불부보지료DWL결구적저공모、제고료용여자원적이용솔,이차쾌속방문적특성,종이제고료존저기적고장수복솔。
Embedded memory in the SoC technology gradually become main body design structure,due to the existence of the problem,memory rate was designed in storage so built-in test and built-in since the strategy to solve the repair,mainly:based on redundancy done repair strategy,based on redundancy column repair strategy and based on redundancy word repair strategy in memory,however,using one-dimensional redundant blocks repair strategy will take more redundant piece,if by 2-d redundant blocks repair increased even repair rate,but makes its stability and reliability,and therefore improve the reduced DWL repair concept based on the strategy,make it not only keep up DWL structure and low power consumption and improve the utilization rate of redundant,and the characteristics of quick access,thereby improving the memory of fault restoration rate.