半导体学报
半導體學報
반도체학보
CHINESE JOURNAL OF SEMICONDUCTORS
2008年
8期
1517-1522
,共6页
周前能%王永生%喻明艳%叶以正%李红娟
週前能%王永生%喻明豔%葉以正%李紅娟
주전능%왕영생%유명염%협이정%리홍연
CMOS带隙基准%电流源%电源抑制比%预调整器
CMOS帶隙基準%電流源%電源抑製比%預調整器
CMOS대극기준%전류원%전원억제비%예조정기
CMOS bandgap reference%current source circuit%PSRR%pre-regulator
提出一种输出低于1V的、无电阻高电源抑制比的CMOS带隙基准源(BGR).该电路适用于片上电源转换器.用HJTC0.18μm CMOS工艺设计并流片实现了该带隙基准源,芯片面积(不包括pad和静电保护电路)为0.031mm2.测试结果表明,采用前调制器结构,带隙基准源电路的输出在100Hz与lkHz处分别获得了-70与-62dB的高电源抑制比.电路输出一个0.5582V的稳定参考电压,当温度在0~85℃范围内变化时,输出电压的变化仅为1.5mV.电源电压VDD在2.4~4V范围内变化时,带隙基准输出电压的变化不超过2mV.
提齣一種輸齣低于1V的、無電阻高電源抑製比的CMOS帶隙基準源(BGR).該電路適用于片上電源轉換器.用HJTC0.18μm CMOS工藝設計併流片實現瞭該帶隙基準源,芯片麵積(不包括pad和靜電保護電路)為0.031mm2.測試結果錶明,採用前調製器結構,帶隙基準源電路的輸齣在100Hz與lkHz處分彆穫得瞭-70與-62dB的高電源抑製比.電路輸齣一箇0.5582V的穩定參攷電壓,噹溫度在0~85℃範圍內變化時,輸齣電壓的變化僅為1.5mV.電源電壓VDD在2.4~4V範圍內變化時,帶隙基準輸齣電壓的變化不超過2mV.
제출일충수출저우1V적、무전조고전원억제비적CMOS대극기준원(BGR).해전로괄용우편상전원전환기.용HJTC0.18μm CMOS공예설계병류편실현료해대극기준원,심편면적(불포괄pad화정전보호전로)위0.031mm2.측시결과표명,채용전조제기결구,대극기준원전로적수출재100Hz여lkHz처분별획득료-70여-62dB적고전원억제비.전로수출일개0.5582V적은정삼고전압,당온도재0~85℃범위내변화시,수출전압적변화부위1.5mV.전원전압VDD재2.4~4V범위내변화시,대극기준수출전압적변화불초과2mV.
A CMOS bandgap reference (BGR) without a resistor,with a high power supply rejection ratio and output be-low 1V is proposed.The circuit is suited for on-chip voltage down converters.The BGR is designed and fabricated using an HJTC 0.18μm CMOS process.The silicon area is only 0.031mm2 excluding pads and electrostatic-discharge (ESD) protec-tion circuits.Experimental results show that the PSRR of the proposed BGR at 100Hz and 1kHz achieves,respectively,-70 and -62dB using the pre-regulator.The proposed BGR circuit generates an output voltage of 0.5582V with a varia-tion of 1.5mV in a temperature range from 0 to 85℃.The deviation of the output voltage is within 2mV when the power supply voltage VDD changes from 2.4 to 4V.