常熟理工学院学报
常熟理工學院學報
상숙리공학원학보
JOURNAL OF CHANGSHU INSTITUTE OF TECHNOLOGY
2011年
10期
76-79
,共4页
透明板%折射率%厚度%外差干涉技术%相位差
透明闆%摺射率%厚度%外差榦涉技術%相位差
투명판%절사솔%후도%외차간섭기술%상위차
transparent plate%refractive index%thickness%heterodyne interferometry%phase difference
通过分析圆偏振外差光束分别经透明板反射和透射后的s光和p光的相位差改变,得到了它们与透明板折射率和厚度的关系.利用改进的M-Z干涉仪设计和构建了能同时测定透明板的折射率和厚度的实验装置,通过测量从透明板反射的圆偏振外差光束的s光和p光的相位差,将测量数据代入理论上导出的特定方程,可以计算出被测透明板的折射率.同时,透明板又在改进的M-Z干涉仪的测量臂中,由波长偏移和光通过透明板引起s光和p光的相位差改变.由透明板折射率的测量值、相位差改变和波长偏移的特定值可得到透明板的厚度.从而实现在同一光学构造下完成对透明板的折射率和厚度的同时测量.
通過分析圓偏振外差光束分彆經透明闆反射和透射後的s光和p光的相位差改變,得到瞭它們與透明闆摺射率和厚度的關繫.利用改進的M-Z榦涉儀設計和構建瞭能同時測定透明闆的摺射率和厚度的實驗裝置,通過測量從透明闆反射的圓偏振外差光束的s光和p光的相位差,將測量數據代入理論上導齣的特定方程,可以計算齣被測透明闆的摺射率.同時,透明闆又在改進的M-Z榦涉儀的測量臂中,由波長偏移和光通過透明闆引起s光和p光的相位差改變.由透明闆摺射率的測量值、相位差改變和波長偏移的特定值可得到透明闆的厚度.從而實現在同一光學構造下完成對透明闆的摺射率和厚度的同時測量.
통과분석원편진외차광속분별경투명판반사화투사후적s광화p광적상위차개변,득도료타문여투명판절사솔화후도적관계.이용개진적M-Z간섭의설계화구건료능동시측정투명판적절사솔화후도적실험장치,통과측량종투명판반사적원편진외차광속적s광화p광적상위차,장측량수거대입이론상도출적특정방정,가이계산출피측투명판적절사솔.동시,투명판우재개진적M-Z간섭의적측량비중,유파장편이화광통과투명판인기s광화p광적상위차개변.유투명판절사솔적측량치、상위차개변화파장편이적특정치가득도투명판적후도.종이실현재동일광학구조하완성대투명판적절사솔화후도적동시측량.
The phase difference between s- and p-polarizations of a circularly polarized heterodyne light beam reflected from a transparent plate is measured. The measured data is substituted into the specially derived equations and the refractive index can be calculated. Next, the variations of phase difference between s- and p-polarizations due to the wavelength shift and the extraction of the plate in a modified Mach-Zehnder interferometer are measured. Then, its thickness can be calculated based on the measured value of refractive index, the variations of phase difference, and the specified value of wavelength shift. Thus, refractive index and thickness of a transparent plate can be measured simultaneously with the same technique.
