材料科学技术学报（英文版）
材料科學技術學報（英文版）
재료과학기술학보（영문판）
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
2003年
2期
189-190
,共2页
Thallium bromide%Temperature factors%Debye temperature%Rietveld refinement%Neutron diffraction%X-ray diffraction
Thermal parameters of TIBr were determined using both X-ray and neutron diffraction techniques. The data was analysed by Rietveld profile refinement procedure. From the neutron diffraction data, due to weak odd-order reflections, it was not possible to determine the individual thermal parameters. The X-ray diffraction measurements yielded BT1=0.296(5) nm2 and BBr=0.162(5) nm2. The overall isotropic value, B was 0.252(7) nm2 which is in good agreement with B=0.230(8) nm2 obtained from present neutron diffraction measurements. The present values are also in good agreement with theoretical estimates obtained from the shell models.
