半导体学报
半導體學報
반도체학보
CHINESE JOURNAL OF SEMICONDUCTORS
2000年
11期
1060-1063
,共4页
normal distribution%PDO%proportional difference estimate%reliability
By proportional differentiating cumulative distribution function of normal distribution,the spectroscopy characteristics are found. The characteristic parameters can be extracted directly from the height and position of the spectroscopy peaks. On this basis ,a new method for determining these parameters of normal distribution is developed. This method can be applied to microelectronics reliability study.
