光学精密工程
光學精密工程
광학정밀공정
OPTICS AND PRECISION ENGINEERING
2007年
12期
1915-1920
,共6页
周洪军%钟鹏飞%霍同林%郑津津%张国斌%戚泽明
週洪軍%鐘鵬飛%霍同林%鄭津津%張國斌%慼澤明
주홍군%종붕비%곽동림%정진진%장국빈%척택명
同步辐射%高次谐波抑制%滤片
同步輻射%高次諧波抑製%濾片
동보복사%고차해파억제%려편
synchrotron radiation%higher-order harmonic suppression%filter
国家同步辐射实验室光谱辐射标准和计量光束线(U27)的SGM分支是专门为光学元件性能测试和探测器定标而建造的.为了能够精确测量光学元件在极紫外和软X射线波段的性能,必须充分抑制高次谐波提高光谱纯度.对于已经建成的光束线,要改变光学设计和现有结构来抑制高次谐波是困难的,最简单且有效的方法是用不同材料的滤片来抑制不同波段的高次谐波.为了研究高次谐波的抑制效果,可将840 1/mm透射光栅放在U27光束线SGM分支的出射狭缝后面色散出射光,用探测器做角度扫描记录下信号强度曲线,然后分析得到高次谐波的含量和分布.本文分别研究了不同厚度的Al(200、400和600 nm)、Si3N4/Mo/Si,Si3N4/Mo/Si/Mo/Si多层膜滤片(100/50/200 nm,100/50/150/150/250 nm)和Al/Mg/Al滤片对13~43 nm光谱高次谐波的抑制效果.研究结果显示,400 nm厚的Al滤片适合于17~33 nm光谱高次谐波的抑制,在保证探测器信号强度的条件下,高次谐波信号强度占探测器信号强度的比例<2%,经探测器量子效率修正后,高次谐波比例<0.6%.Si3N4/Mo/Si/Mo/Si多层膜滤片可以有效地抑制13~19 nm的高次谐波,Al/Mg/Al滤片对30~43 nm的高次谐波有很好的抑制作用.这一结果为光学元件的透射率、反射率和探测器精确定标奠定了基础.
國傢同步輻射實驗室光譜輻射標準和計量光束線(U27)的SGM分支是專門為光學元件性能測試和探測器定標而建造的.為瞭能夠精確測量光學元件在極紫外和軟X射線波段的性能,必鬚充分抑製高次諧波提高光譜純度.對于已經建成的光束線,要改變光學設計和現有結構來抑製高次諧波是睏難的,最簡單且有效的方法是用不同材料的濾片來抑製不同波段的高次諧波.為瞭研究高次諧波的抑製效果,可將840 1/mm透射光柵放在U27光束線SGM分支的齣射狹縫後麵色散齣射光,用探測器做角度掃描記錄下信號彊度麯線,然後分析得到高次諧波的含量和分佈.本文分彆研究瞭不同厚度的Al(200、400和600 nm)、Si3N4/Mo/Si,Si3N4/Mo/Si/Mo/Si多層膜濾片(100/50/200 nm,100/50/150/150/250 nm)和Al/Mg/Al濾片對13~43 nm光譜高次諧波的抑製效果.研究結果顯示,400 nm厚的Al濾片適閤于17~33 nm光譜高次諧波的抑製,在保證探測器信號彊度的條件下,高次諧波信號彊度佔探測器信號彊度的比例<2%,經探測器量子效率脩正後,高次諧波比例<0.6%.Si3N4/Mo/Si/Mo/Si多層膜濾片可以有效地抑製13~19 nm的高次諧波,Al/Mg/Al濾片對30~43 nm的高次諧波有很好的抑製作用.這一結果為光學元件的透射率、反射率和探測器精確定標奠定瞭基礎.
국가동보복사실험실광보복사표준화계량광속선(U27)적SGM분지시전문위광학원건성능측시화탐측기정표이건조적.위료능구정학측량광학원건재겁자외화연X사선파단적성능,필수충분억제고차해파제고광보순도.대우이경건성적광속선,요개변광학설계화현유결구래억제고차해파시곤난적,최간단차유효적방법시용불동재료적려편래억제불동파단적고차해파.위료연구고차해파적억제효과,가장840 1/mm투사광책방재U27광속선SGM분지적출사협봉후면색산출사광,용탐측기주각도소묘기록하신호강도곡선,연후분석득도고차해파적함량화분포.본문분별연구료불동후도적Al(200、400화600 nm)、Si3N4/Mo/Si,Si3N4/Mo/Si/Mo/Si다층막려편(100/50/200 nm,100/50/150/150/250 nm)화Al/Mg/Al려편대13~43 nm광보고차해파적억제효과.연구결과현시,400 nm후적Al려편괄합우17~33 nm광보고차해파적억제,재보증탐측기신호강도적조건하,고차해파신호강도점탐측기신호강도적비례<2%,경탐측기양자효솔수정후,고차해파비례<0.6%.Si3N4/Mo/Si/Mo/Si다층막려편가이유효지억제13~19 nm적고차해파,Al/Mg/Al려편대30~43 nm적고차해파유흔호적억제작용.저일결과위광학원건적투사솔、반사솔화탐측기정학정표전정료기출.
The Spherical Grating Monochromator(SGM)branch of Spectral Radiation Standard and Metrology(U27)beamline is specially built for measurement of the properties of optical elements and detectors.In order to accurately measure the performance of optical elements,higher-order harmonics must be suppressed efficiently.For the existing beamline where the design cannot readily be altered,the simplest method is to use transmission filters to suppress higher-order harmonics.With a 840 1/mm transmission grating used behind the exit of SGM in U27 beamline,the exit beam can be dispersed and the contributions of the different orders can be analyzed.Results of higher-order suppression by 200 nm,400 nm,600 nm thickness Al filters,100/50/200 nm,100/50/150/150/250 nm thickness Si3 N4/Mo/Si,Si3N4/Mo/Si/Mo/Si multilayers and Al/Mg/Al filter in the region of 13~43 nm show that when the thickness of Al filter is 400 nm,and the wavelength is between 17 nm and 33 nm,the contributions of higher orders to the detector signal intensity are less than 2% ,and the detector intensity is strong enough when the beam on.After being corrected by quantum efficiency of the detector,higher order contributions are less than 0.6%.Si3N4/Mo/Si/Mo/Si filter can be efficiently used to suppress higher-order harmonics in the region of 13~19 nm,and Al/Mg/Al filter can be used to suppress higher-order harmonics in the region of 30~43 nm efficiently.These are important for the accurate calibration of absolute reflectivities of multilayer and detector etc.