强激光与粒子束
彊激光與粒子束
강격광여입자속
HIGH POWER LASER AND PARTICLEBEAMS
2009年
7期
961-969
,共9页
特征X射线%氢气%新谱线%靶%气体放电源
特徵X射線%氫氣%新譜線%靶%氣體放電源
특정X사선%경기%신보선%파%기체방전원
characteristic X-ray%hyrogen gas%new spectral line%target%gas discharge source
在氢气放电源打靶的实验中,测到了系列能量恒定不变的低能X射线新谱线,这些新谱线的能量分别为(1.70±0.10)keV,(2.25±0.07)keV,(2.56±0.08) keV,(3.25±0.10) keV和(3.62±0.11) keV,与Si,Ta,S,Cl,K和Ca等元素的特征X射线能量相近,但靶中所含的杂质或来自放电室的杂质元素可能会产生这些能量的X射线谱峰,证实新谱线是否由这些元素的特征X射线干扰所致显得尤为重要.分析了本实验系统中各种杂质的可能来源,论证了放电室端杂质对新谱线的影响,及靶材料中体杂质和面杂质对新谱线的影响;用X射线光电子能谱仪对靶做了表面分析.研究结果表明:杂质元素的特征X射线不会对氢气放电源打靶产生的新谱线有影响.这些新谱线的性质有待进一步的实验研究.
在氫氣放電源打靶的實驗中,測到瞭繫列能量恆定不變的低能X射線新譜線,這些新譜線的能量分彆為(1.70±0.10)keV,(2.25±0.07)keV,(2.56±0.08) keV,(3.25±0.10) keV和(3.62±0.11) keV,與Si,Ta,S,Cl,K和Ca等元素的特徵X射線能量相近,但靶中所含的雜質或來自放電室的雜質元素可能會產生這些能量的X射線譜峰,證實新譜線是否由這些元素的特徵X射線榦擾所緻顯得尤為重要.分析瞭本實驗繫統中各種雜質的可能來源,論證瞭放電室耑雜質對新譜線的影響,及靶材料中體雜質和麵雜質對新譜線的影響;用X射線光電子能譜儀對靶做瞭錶麵分析.研究結果錶明:雜質元素的特徵X射線不會對氫氣放電源打靶產生的新譜線有影響.這些新譜線的性質有待進一步的實驗研究.
재경기방전원타파적실험중,측도료계렬능량항정불변적저능X사선신보선,저사신보선적능량분별위(1.70±0.10)keV,(2.25±0.07)keV,(2.56±0.08) keV,(3.25±0.10) keV화(3.62±0.11) keV,여Si,Ta,S,Cl,K화Ca등원소적특정X사선능량상근,단파중소함적잡질혹래자방전실적잡질원소가능회산생저사능량적X사선보봉,증실신보선시부유저사원소적특정X사선간우소치현득우위중요.분석료본실험계통중각충잡질적가능래원,론증료방전실단잡질대신보선적영향,급파재료중체잡질화면잡질대신보선적영향;용X사선광전자능보의대파주료표면분석.연구결과표명:잡질원소적특정X사선불회대경기방전원타파산생적신보선유영향.저사신보선적성질유대진일보적실험연구.
A series of low energy X-ray spectral lines which have constant energy have been detected in hydrogen gas discharge source bombarding targets.Their energy are 1.7 keV,2.3 keV,2.6 keV,3.3 keV and 3.7 keV,respectively.These anonymous spectral lines can not be explained by the known theories.There are still possibilities that they are produced by potential impurity elements in targets or in the discharge chamber,although the energy of the anonymous spectral lines are close to the energy of the characteristic X-ray of some elements,such as Si,Ta,S,Cl,K,Ca and Ti,etc.In this paper,the origin of impurity elements in the experimental system are analyzed,the influence of impurity elements in the discharge chamber and targets on the new spectral lines are studied,and the target surface is analyzed by X-ray photoelectron spectroscopy.The study shows that the impurity elements have no influence on the generation of the anonymous spectral lines.The characteristics of the anonymous spectral lines need further experimental and theoretical study.
