CAJ | 학술논문

参数漂移模型描述了元件参数从额定值发生偏移的行为。随着可靠性朝无故障寿命或无需维修工作周期的方向发展，对产品的参数漂移进行研究越来越显重要。利用MΦ Itoft统计模型描述了电子元件的参数漂移行为，通过元件的早期寿命测试来预测元件寿命，并给出了应用实例。
삼수표이모형묘술료원건삼수종액정치발생편이적행위。수착가고성조무고장수명혹무수유수공작주기적방향발전，대산품적삼수표이진행연구월래월현중요。이용MΦ Itoft통계모형묘술료전자원건적삼수표이행위，통과원건적조기수명측시래예측원건수명，병급출료응용실례。
Parametric drift model describes behaviors of components as they drift away from their nominal values. Study on parametric drift behavior is much more important as reliability is developing toward failure-free or maintenance-freenmoperating. With MΦItoft statistical model, parametric drift behaviors of electronic components are described, and lifetime of components predicted on the basis of early life measurements. An example is given. (3 refs.)