CAJ | 학술논문

采用X2001应力分析仪测试了α-Fe和铍样品表面分别覆盖聚乙烯膜前后的残余应力，探讨了残余应力测试值变化的原因及其规律。样品表面覆盖聚乙烯膜后，由于校准距离D的增大，使得衍射峰向低角度方向偏移，从而引起应力实测值发生了改变。通过对应力实测值进行修正，可获得样品内的真实应力。
채용X2001응력분석의측시료α-Fe화피양품표면분별복개취을희막전후적잔여응력，탐토료잔여응력측시치변화적원인급기규률。양품표면복개취을희막후，유우교준거리D적증대，사득연사봉향저각도방향편이，종이인기응력실측치발생료개변。통과대응력실측치진행수정，가획득양품내적진실응력。
The residual stresses of α-Fe and beryllium specimen surface withand without the Mylar film are measured by X2001 stress analyzer. The reason and the regulation of the measured residual stress change are discussed. The results show that the increasement of the calibration distance D for the specimen surface with the Mylar film shiftes the diffraction peak to the lower angle, thus changing the measured value of residual stress. The real residual stress of specimen can be obtained by correcting the measured value of residual stress.