FP腔半导体激光器的腔内损耗和准费米能级差的测量
FP강반도체격광기적강내손모화준비미능급차적측량
Measurement of Cavity Loss and Quasi-Fermi-Level Separation for Fabry-Pérot Semiconductor Lasers
  • 万方数据
    半导体学报 반도체학보
    CHINESE JOURNAL OF SEMICONDUCTORS
    2003年 8期 789-793 ,共5页

    韩春林%刘瑞喜%国伟华%于丽娟%黄永箴

    한춘림%류서희%국위화%우려연%황영잠

    半导体激光器%测量技术%腔内损耗 半導體激光器%測量技術%腔內損耗
    반도체격광기%측량기술%강내손모
    semiconductor lasers%measurement technique%cavity loss
    利用一种拟合方法测量FP腔半导体激光器的腔内损耗和准费米能级差.从放大的自发发射谱,利用Cassidy方法得到用于拟合过程的增益谱和单程放大的自发发射谱.利用上述方法,测出的1550nm InGaAsP量子阱脊型波导结构激光器的腔内损耗大约为24cm-1.
    이용일충의합방법측량FP강반도체격광기적강내손모화준비미능급차.종방대적자발발사보,이용Cassidy방법득도용우의합과정적증익보화단정방대적자발발사보.이용상술방법,측출적1550nm InGaAsP양자정척형파도결구격광기적강내손모대약위24cm-1.
    A fitting process is used to measure the cavity loss and the quasi-Fermi-level separation for Fabry- Pérot semiconductor lasers.From the amplified spontaneous emission (ASE) spectrum,the gain spectrum and single-pass ASE obtained by the Cassidy method are applied in the fitting process.For a 1550nm quantum well InGaAsP ridge waveguide laser,the cavity loss of about ～24cm-1 is obtained.
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