合成技术及应用
閤成技術及應用
합성기술급응용
SYNTHETIC TECHNOLOGY AND APPLICATION
2011年
2期
56-60
,共5页
扫描电镜%色差%织物%纱线%纤维
掃描電鏡%色差%織物%紗線%纖維
소묘전경%색차%직물%사선%섬유
Scanning Electron Microscope（SEM）%color defect%fabric%yarn%fiber
介绍了一种使用扫描电子显微镜分析织物色差原因的方法,通过对织物结构、纱线质量进行形貌分析,发现织物密度、纱线质量以及并丝、僵丝、断头、未牵伸丝等纤维疵点是织物产生色差的原因。结果表明,该方法具有快速、便捷、准确的优点,可以完全满足生产、营销的技术需要。
介紹瞭一種使用掃描電子顯微鏡分析織物色差原因的方法,通過對織物結構、紗線質量進行形貌分析,髮現織物密度、紗線質量以及併絲、僵絲、斷頭、未牽伸絲等纖維疵點是織物產生色差的原因。結果錶明,該方法具有快速、便捷、準確的優點,可以完全滿足生產、營銷的技術需要。
개소료일충사용소묘전자현미경분석직물색차원인적방법,통과대직물결구、사선질량진행형모분석,발현직물밀도、사선질량이급병사、강사、단두、미견신사등섬유자점시직물산생색차적원인。결과표명,해방법구유쾌속、편첩、준학적우점,가이완전만족생산、영소적기술수요。
This paper discussed a new method for analyzing the cause of fabric and yarn with color defect by scanning electron microscope.We found that the numerous cause of color defect on fabric were fabric structure density and the quality of yarn and fiber by analyzing fabric and yarn texture.This method had the advantage of fast and accurate and it could fully satisfy the need of manufacture and distribution.
