液晶与显示
液晶與顯示
액정여현시
CHINESE JOURNAL OF LIQUID CRYSTALS AND DISPLAYS
2007年
5期
512-515
,共4页
李颖弢%刘肃%王方聪%张春林%岳红菊
李穎弢%劉肅%王方聰%張春林%嶽紅菊
리영도%류숙%왕방총%장춘림%악홍국
OLEDs%LiF%电容
OLEDs%LiF%電容
OLEDs%LiF%전용
OLEDs%LiF%capacitance
已经有多种方法分析了LiF作为电子注入缓冲层对有机电致发光器件的影响,用LiF/Al双层阴极和发光层Alq3制成的有机电致发光器件(OLED), 可以降低器件的开启电压,提高器件的发光效率、发光亮度.文章主要对OLEDs (A): Al/Alq3/ITO和(B): Al /LiF(1nm)/Alq3/ITO的C-V特性进行了研究,当在阴极和发光层Alq3之间加上1 nm厚的LiF层作为电子注入缓冲层以后,器件的电容由不加LiF时的72 500 pF减小到12 500 pF,由于电容的减小,有效地降低了器件的功耗,进而提高了器件的寿命,节约了能源,进一步改善了器件的性能.
已經有多種方法分析瞭LiF作為電子註入緩遲層對有機電緻髮光器件的影響,用LiF/Al雙層陰極和髮光層Alq3製成的有機電緻髮光器件(OLED), 可以降低器件的開啟電壓,提高器件的髮光效率、髮光亮度.文章主要對OLEDs (A): Al/Alq3/ITO和(B): Al /LiF(1nm)/Alq3/ITO的C-V特性進行瞭研究,噹在陰極和髮光層Alq3之間加上1 nm厚的LiF層作為電子註入緩遲層以後,器件的電容由不加LiF時的72 500 pF減小到12 500 pF,由于電容的減小,有效地降低瞭器件的功耗,進而提高瞭器件的壽命,節約瞭能源,進一步改善瞭器件的性能.
이경유다충방법분석료LiF작위전자주입완충층대유궤전치발광기건적영향,용LiF/Al쌍층음겁화발광층Alq3제성적유궤전치발광기건(OLED), 가이강저기건적개계전압,제고기건적발광효솔、발광량도.문장주요대OLEDs (A): Al/Alq3/ITO화(B): Al /LiF(1nm)/Alq3/ITO적C-V특성진행료연구,당재음겁화발광층Alq3지간가상1 nm후적LiF층작위전자주입완충층이후,기건적전용유불가LiF시적72 500 pF감소도12 500 pF,유우전용적감소,유효지강저료기건적공모,진이제고료기건적수명,절약료능원,진일보개선료기건적성능.
Numerical methods have been used to analyze the contribution of LiF layer which is inserted between the cathode and the electron-transporting layer in organic light emitting devices (OLEDs). The LiF as the electron injection buffer layer can improve the performance of the OLEDs, including reducing the cut-in voltage, increasing the current and emitting luminance. This work fabricates two different kinds of devices A and B with structures of Indium Tin Oxide (ITO)/tris-(8-hydroxyquinoline) aluminum (Alq3)/Al and ITO/Alq3/LiF/Al, using the C-V characteristic to analyze the roles of LiF in OLEDs and finding the capacitance of the device A and B is 72 500 pF and 12 500 pF, respectively. At the same time, this paper interprets why LiF could reduce the capacitance and the power consumption of the OLEDs from the correct point of view. It shows that the LiF layer improves the performance of the OLEDs and saves the energy sources, resulting in the change of the capacitance of the devices.