微纳电子技术
微納電子技術
미납전자기술
MICRONANOELECTRONIC TECHNOLOGY
2010年
1期
18-24
,共7页
曹玉萍%薛成山%石锋%孙海波%郭永福%刘文军
曹玉萍%薛成山%石鋒%孫海波%郭永福%劉文軍
조옥평%설성산%석봉%손해파%곽영복%류문군
GaN纳米结构%Si衬底%钴%氨化%溅射
GaN納米結構%Si襯底%鈷%氨化%濺射
GaN납미결구%Si츤저%고%안화%천사
GaN nanostructures%Si substrates%Co%ammoniate%sputtering
通过磁控溅射技术在Si (111)衬底上沉积Ga2O3/Co薄膜,然后在不同温度下氨化制得GaN纳米结构.采用X射线衍射(XRD)、傅里叶红外吸收谱(FTIR)、扫描电子显微镜(SEM)、高分辨透射电镜(HRTEM)和光致发光谱(PL)对样品的结构、形貌和光学特性进行了表征.结果显示合成的GaN纳米结构具有六方纤锌矿结构,且纳米结构的生长受温度影响很大.PL谱显示在388 nm处有一强的紫外发光峰,表明其在低维激光器件方面的应用优势.同时对纳米结构的生长机制进行了简单讨论.
通過磁控濺射技術在Si (111)襯底上沉積Ga2O3/Co薄膜,然後在不同溫度下氨化製得GaN納米結構.採用X射線衍射(XRD)、傅裏葉紅外吸收譜(FTIR)、掃描電子顯微鏡(SEM)、高分辨透射電鏡(HRTEM)和光緻髮光譜(PL)對樣品的結構、形貌和光學特性進行瞭錶徵.結果顯示閤成的GaN納米結構具有六方纖鋅礦結構,且納米結構的生長受溫度影響很大.PL譜顯示在388 nm處有一彊的紫外髮光峰,錶明其在低維激光器件方麵的應用優勢.同時對納米結構的生長機製進行瞭簡單討論.
통과자공천사기술재Si (111)츤저상침적Ga2O3/Co박막,연후재불동온도하안화제득GaN납미결구.채용X사선연사(XRD)、부리협홍외흡수보(FTIR)、소묘전자현미경(SEM)、고분변투사전경(HRTEM)화광치발광보(PL)대양품적결구、형모화광학특성진행료표정.결과현시합성적GaN납미결구구유륙방섬자광결구,차납미결구적생장수온도영향흔대.PL보현시재388 nm처유일강적자외발광봉,표명기재저유격광기건방면적응용우세.동시대납미결구적생장궤제진행료간단토론.
GaN nanostructures were synthesized on Si (111) substrates through ammoniating the Ga2O3/Co films at different temperatures by magnetron sputtering system.The structure,morphology and optical properties of the samples were characterized by X-ray diffraction (XRD),Fourier transform infrared spectroscopy (FTIR),scanning electron microscopy (SEM),high resolution transmission electron microscopy (HRTEM) and photoluminescence (PL).The resuits show that the synthesized GaN nanostructures are of hexagonal wurtzite structure,and the growth of GaN nanostructures is affected greatly by the temperature.The PL results reveal a strong UV emission at 388 nm,which will have a good advantage in applications of low-dimensional laser devices.The growth mechanism was also briefly discussed.