原位弯曲阴极法测量不同基体上电沉积铜膜和镍膜的内应力
원위만곡음겁법측량불동기체상전침적동막화얼막적내응력
Determination of internal stress in Cu and Ni films on different substrates by in-situ bent-cathode method
저자의 최근 논문