红外与激光工程
紅外與激光工程
홍외여격광공정
INFRARED AND LASER ENGINEERING
2010年
3期
452-459
,共8页
吉世印%桑田%蔡托%刘华松%季一勤%王占山
吉世印%桑田%蔡託%劉華鬆%季一勤%王佔山
길세인%상전%채탁%류화송%계일근%왕점산
泄漏模特性%共振布儒斯特滤光片%多模共振
洩漏模特性%共振佈儒斯特濾光片%多模共振
설루모특성%공진포유사특려광편%다모공진
Leaky-mode characteristics%Resonant Brewster filters%Multimode resonance
通过调整光栅的填充系数,获得具有均质层和光栅层等效折射率相等的表面浮雕结构共振布儒斯特滤光片.深入研究了这类滤光片的泄漏模特性,并讨论光栅参数和入射条件的变化对滤光片共振特性的影响.研究表明:入射角的改变对滤光片泄漏模特性的影响不明显,但填充系数、均质层厚度以及基底折射率的改变对滤光片泄漏模特性影响很大.当填充系数f→1和f<0.6时,以及当基底折射率接近波导层折射率(n→1.63)时,导模共振效应趋于消失.此外,随着均质层厚度的不断增大,多模共振效应将被激发,从而在一定的波长或入射角范围内导致多个泄漏模共振效应的产生.
通過調整光柵的填充繫數,穫得具有均質層和光柵層等效摺射率相等的錶麵浮彫結構共振佈儒斯特濾光片.深入研究瞭這類濾光片的洩漏模特性,併討論光柵參數和入射條件的變化對濾光片共振特性的影響.研究錶明:入射角的改變對濾光片洩漏模特性的影響不明顯,但填充繫數、均質層厚度以及基底摺射率的改變對濾光片洩漏模特性影響很大.噹填充繫數f→1和f<0.6時,以及噹基底摺射率接近波導層摺射率(n→1.63)時,導模共振效應趨于消失.此外,隨著均質層厚度的不斷增大,多模共振效應將被激髮,從而在一定的波長或入射角範圍內導緻多箇洩漏模共振效應的產生.
통과조정광책적전충계수,획득구유균질층화광책층등효절사솔상등적표면부조결구공진포유사특려광편.심입연구료저류려광편적설루모특성,병토론광책삼수화입사조건적변화대려광편공진특성적영향.연구표명:입사각적개변대려광편설루모특성적영향불명현,단전충계수、균질층후도이급기저절사솔적개변대려광편설루모특성영향흔대.당전충계수f→1화f<0.6시,이급당기저절사솔접근파도층절사솔(n→1.63)시,도모공진효응추우소실.차외,수착균질층후도적불단증대,다모공진효응장피격발,종이재일정적파장혹입사각범위내도치다개설루모공진효응적산생.
The double-layer surface-relief resonant Brewster filters consisting of a homogenous layer and a grating layer wim equal refractive index are obtained by adjusting the gradng filling factor,and leaky-mode mechanisms of these types of filters are investigated.The main resonance features observed under variation of the filter parameters and incident angle are discussed.It is shown that changing the incidence angle has little effect on the leaky-mode characteristics,but varying the grating tilling factor,the homogeneous layer thickness and substrate refractive index can be significant.As the grating filling factor f→1 and f<0.6,and as the refractive index of the substrate approaches the refractive index of the waveguide layer(ns→1.63),guided-mode resonance effect will vanish.In addition,as the homogenous layer thickness increases,multiple resonances may be arisen that yield several peaks within a certain wavelength or angular range,exhibiting the unique signature of multiple leaky-mode resonances.