半导体学报
半導體學報
반도체학보
CHINESE JOURNAL OF SEMICONDUCTORS
2008年
4期
663-667
,共5页
苗庆海%卢烁今%张兴华%宗福建%朱阳军
苗慶海%盧爍今%張興華%宗福建%硃暘軍
묘경해%로삭금%장흥화%종복건%주양군
半导体势垒%禁带宽度%汇聚点%正向I-V特性曲线
半導體勢壘%禁帶寬度%彙聚點%正嚮I-V特性麯線
반도체세루%금대관도%회취점%정향I-V특성곡선
semiconductor barrier%bandgap%convergent point%forward I-V characteristic curves
以正向电压为自变量,以正向电流的对数为应变量,以温度为参数得到的p-n结的I-V-(T)特性曲线在第一象限中近似汇聚于一点.汇聚点对应的电压近似等于半导体材料的禁带宽度.汇聚点可以用来获取任意温度下的I-V特性曲线.
以正嚮電壓為自變量,以正嚮電流的對數為應變量,以溫度為參數得到的p-n結的I-V-(T)特性麯線在第一象限中近似彙聚于一點.彙聚點對應的電壓近似等于半導體材料的禁帶寬度.彙聚點可以用來穫取任意溫度下的I-V特性麯線.
이정향전압위자변량,이정향전류적대수위응변량,이온도위삼수득도적p-n결적I-V-(T)특성곡선재제일상한중근사회취우일점.회취점대응적전압근사등우반도체재료적금대관도.회취점가이용래획취임의온도하적I-V특성곡선.
The I-V-(T) characteristic curves of p-n junctions with the forward voltage as the independent variable, the logarithm of forward current as the dependent variable, and the junction temperature as the parameter, almost converge at one point in the first quadrant. The voltage corresponding with the convergence point nearly equals the bandgap of the semiconductor material. This convergence point can be used to obtain the I-V characteristic curve at any temperature.