CAJ | 학술논문

针对电子元器件的表面缺陷对其性能和品质有直接影响的问题,基于图像处理技术,以晶振外壳缺陷的检.测为例,研究了电子元器件表面缺陷的检测技术.首先建立了检测系统平台,然后对所获取的图像进行分析和检测目标分割,并由生成的灰度共生矩阵计算纹理特性值.基于惯性值对纹理的深浅具有敏感性,比较研究之后,采用了惯性值作为检测表面缺陷的指标.试验结果表明该方法能够有效检测平面缺陷.
침대전자원기건적표면결함대기성능화품질유직접영향적문제,기우도상처리기술,이정진외각결함적검.측위례,연구료전자원기건표면결함적검측기술.수선건립료검측계통평태,연후대소획취적도상진행분석화검측목표분할,병유생성적회도공생구진계산문리특성치.기우관성치대문리적심천구유민감성,비교연구지후,채용료관성치작위검측표면결함적지표.시험결과표명해방법능구유효검측평면결함.
Aiming at the Influence of electronic components' surface quality for its properties and performance, surface defect de-tection technology was researched based on image processing technology, and the detection of crystal oscillator's shell was used as an example. Firstly, the detection system platform was set up. Then, the treatment of acquainting images was fulfilled and grayscale co-occurrence matrix was generated. Because the inertia value is sensitive to the depth of the texture, after the compara-tive study of the value of texture characteristic, the inertia value was selected as the target of identification of the crystal surface de-fects. The research results show that this method can effectively detect planar defects.