半导体光电
半導體光電
반도체광전
SEMICONDUCTOR OPTOELECTRONICS
2001年
1期
69-72
,共4页
光折变晶体%全息干涉%光折变%光楔
光摺變晶體%全息榦涉%光摺變%光楔
광절변정체%전식간섭%광절변%광설
光折变晶体是一种新型的记录材料，应用光折变效应，不需显影、定影等处理，就可实现实时观测。文章探讨了光折变实时全息干涉法在光学检测中的应用，提出同时确定光楔楔角和折射率的新方法，从而改变了只有光楔的折射率和楔角中一个已知时才可测量另一个未知量的传统测量方法。介绍了实验过程，分析得出了最后实验结果。
光摺變晶體是一種新型的記錄材料，應用光摺變效應，不需顯影、定影等處理，就可實現實時觀測。文章探討瞭光摺變實時全息榦涉法在光學檢測中的應用，提齣同時確定光楔楔角和摺射率的新方法，從而改變瞭隻有光楔的摺射率和楔角中一箇已知時纔可測量另一箇未知量的傳統測量方法。介紹瞭實驗過程，分析得齣瞭最後實驗結果。
광절변정체시일충신형적기록재료，응용광절변효응，불수현영、정영등처리，취가실현실시관측。문장탐토료광절변실시전식간섭법재광학검측중적응용，제출동시학정광설설각화절사솔적신방법，종이개변료지유광설적절사솔화설각중일개이지시재가측량령일개미지량적전통측량방법。개소료실험과정，분석득출료최후실험결과。
Photorefractive crystals (PRCs) are very promising recording materials for holographic interferometry as they don't need developing and fixing and can realize the real-time testing. Investigation on the application is carried out in optical testing by holographic interferometry using PRCs as real-time recording and reconstruction materials.The simultaneous determination of refractive index and the wedge angle of an optical wedge plate is proposed. This novel method has changed the traditional view that the two parameters can not be determined at the same time. The experimental procedure in detail and final results are obtained.
