哈尔滨工业大学学报(英文版)
哈爾濱工業大學學報(英文版)
합이빈공업대학학보(영문판)
JOURNAL OF HARBIN INSTITUTE OF TECHNOLOGY
2004年
2期
223-227
,共5页
国立秋%徐宗伟%赵铁强%赵清亮%张飞虎%董申
國立鞦%徐宗偉%趙鐵彊%趙清亮%張飛虎%董申
국립추%서종위%조철강%조청량%장비호%동신
carbon nanotube%atomic force microscope (AFM)%probe
Ordinary AFM probes' characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young' s modulus, unique chemical structure, and well-defined electronic property. Carbon nanotube AFM probes are obtained by using a new method of attaching carbon nanotubes to the end of ordinary AFM probes, and are then used for doing AFM experiments. These experiments indicated that carbon nanotube probes have higher elastic deformation, higher resolution and higher durability. And it was also found that carbon nanotube probes can accurately reflect the morphology of deep narrow gaps, while ordinary probes can not reflect.
