现代制造工程
現代製造工程
현대제조공정
MODERN MANUFACTURING ENGINEERING
2014年
6期
1-5,53
,共6页
射频识别%SUSAN算法%角点检测%视觉定位
射頻識彆%SUSAN算法%角點檢測%視覺定位
사빈식별%SUSAN산법%각점검측%시각정위
RFID%SUSAN%corner detection%visual location
实现微小芯片的凸点和基板天线的互连是射频识别( RFID)电子封装设备的关键技术,其中芯片上凸点的定位是精密操作中的难点之一。研究RFID标签封装设备中芯片上凸点的视觉定位,提出一种基于改进的SUSAN ( Smallest Univalue Segment Assimilating Nucleus )角点检测的算法。用改进的SUSAN角点检测算法提取凸点特征,根据凸点特征计算出凸点的中心坐标,以此得到凸点的位置信息,实现芯片上凸点的精确定位。目前提出的算法已成功应用到RFID封装设备HEI-DIII上,实验结果表明,与常规的特征匹配算法相比,所提出的凸点识别的RFID微小芯片定位算法耗时短,定位精度较高,对扰动和芯片的大角度旋转不敏感。
實現微小芯片的凸點和基闆天線的互連是射頻識彆( RFID)電子封裝設備的關鍵技術,其中芯片上凸點的定位是精密操作中的難點之一。研究RFID標籤封裝設備中芯片上凸點的視覺定位,提齣一種基于改進的SUSAN ( Smallest Univalue Segment Assimilating Nucleus )角點檢測的算法。用改進的SUSAN角點檢測算法提取凸點特徵,根據凸點特徵計算齣凸點的中心坐標,以此得到凸點的位置信息,實現芯片上凸點的精確定位。目前提齣的算法已成功應用到RFID封裝設備HEI-DIII上,實驗結果錶明,與常規的特徵匹配算法相比,所提齣的凸點識彆的RFID微小芯片定位算法耗時短,定位精度較高,對擾動和芯片的大角度鏇轉不敏感。
실현미소심편적철점화기판천선적호련시사빈식별( RFID)전자봉장설비적관건기술,기중심편상철점적정위시정밀조작중적난점지일。연구RFID표첨봉장설비중심편상철점적시각정위,제출일충기우개진적SUSAN ( Smallest Univalue Segment Assimilating Nucleus )각점검측적산법。용개진적SUSAN각점검측산법제취철점특정,근거철점특정계산출철점적중심좌표,이차득도철점적위치신식,실현심편상철점적정학정위。목전제출적산법이성공응용도RFID봉장설비HEI-DIII상,실험결과표명,여상규적특정필배산법상비,소제출적철점식별적RFID미소심편정위산법모시단,정위정도교고,대우동화심편적대각도선전불민감。
The realization of combination the chip and antenna is the key technologies of the electronic packaging devices ,which the visual location is one of the difficulty in the whole precision operation .Research the visual location algorithm for the bumps recongnition in RFID packaging equipment and proposal a new visual location algorithm based on modified SUSAN corner detec -tion algorithm.The algorithm uses the modified SUSAN corner detection algorithm to extract the feature of bump and calculate center coordinates of the bump ,in order to get the location information of the bump .The algorithm has been tested and applied in the RFID package equipment .Experiment results show that compared with conventional algorithms ,the new algorithm achieves in-tended purpose and promise application values with its short consuming-time and high prediction accuracy ,and not sensitive to disturbance and large angle rotation of the chip .