电子测试
電子測試
전자측시
ELECTRONIC TEST
2013年
13期
75-77,88
,共4页
功能验证%覆盖率驱动%遗传算法%双层编码
功能驗證%覆蓋率驅動%遺傳算法%雙層編碼
공능험증%복개솔구동%유전산법%쌍층편마
Functional verification%Coverage-directed%Genetic algorithm%Double-layer encoding
随着集成电路设计复杂度不断提高,功能验证的挑战也不断增大。为了加快验证进程提高覆盖率,提出了一种新的基于遗传算法(Genetic Algorithm, GA)的随机测试生成方法。该方法基于一种二进制和十进制数混合编码的双层编码模式,并使用了权值可自动调控的功能覆盖点来计算个体适应度值,并将模拟过程中的覆盖率报告自动反馈回给随机测试生成的约束产生。该方法已应用于中国科学院微电子研究所自主研发的IME-Diamond数字信号处理器RTL模型的模块功能验证。实验结果表明,该方法有效提高了验证效率。
隨著集成電路設計複雜度不斷提高,功能驗證的挑戰也不斷增大。為瞭加快驗證進程提高覆蓋率,提齣瞭一種新的基于遺傳算法(Genetic Algorithm, GA)的隨機測試生成方法。該方法基于一種二進製和十進製數混閤編碼的雙層編碼模式,併使用瞭權值可自動調控的功能覆蓋點來計算箇體適應度值,併將模擬過程中的覆蓋率報告自動反饋迴給隨機測試生成的約束產生。該方法已應用于中國科學院微電子研究所自主研髮的IME-Diamond數字信號處理器RTL模型的模塊功能驗證。實驗結果錶明,該方法有效提高瞭驗證效率。
수착집성전로설계복잡도불단제고,공능험증적도전야불단증대。위료가쾌험증진정제고복개솔,제출료일충신적기우유전산법(Genetic Algorithm, GA)적수궤측시생성방법。해방법기우일충이진제화십진제수혼합편마적쌍층편마모식,병사용료권치가자동조공적공능복개점래계산개체괄응도치,병장모의과정중적복개솔보고자동반궤회급수궤측시생성적약속산생。해방법이응용우중국과학원미전자연구소자주연발적IME-Diamond수자신호처리기RTL모형적모괴공능험증。실험결과표명,해방법유효제고료험증효솔。
As the complexity of the hardware design increases,so does the challenge of functional verification.Random test generation technology is now commonly used in simulation based verification.In order to speed up the verification process,coverage directed test generation(CDG)has been proposed to lead to better coverage rate.This paper presents a new genetic algorithm based approach to close the feedback loop between coverage report and directives for random test generation.A double-layer encoding mode,which is binary and decimal mixed,is adopted.The functional coverage points,which weights are adjustable automatically,are used to calculate individual fitness.The experiment result shows that the algorithm promotes the efficiency of verification on IME-Diamond DSP processor in RTL level.