现代电子技术
現代電子技術
현대전자기술
MODERN ELECTRONICS TECHNIQUE
2013年
15期
153-156
,共4页
孙冬娥%郭跃安%高华%张莹%冯亚
孫鼕娥%郭躍安%高華%張瑩%馮亞
손동아%곽약안%고화%장형%풍아
并联谐振技术%工频频率%ADI高性能电能计量芯片%ARM系列芯片
併聯諧振技術%工頻頻率%ADI高性能電能計量芯片%ARM繫列芯片
병련해진기술%공빈빈솔%ADI고성능전능계량심편%ARM계렬심편
parallel resonance technology%power frequency%high - performance electric energy metrology chip of ADI%ARM series of chip
采用并联谐振补偿原理，研制了智能型交直流耐压实验装置，装置保证试验电压的工频频率和波形质量。对被试品的状态参数（电压、电流、频率）进行实时采样，并可根据试验要求对电压波形进行智能分析，打印试验结果及波形，仪器测量精度为0.5%。整套设备从传统试验设备的5～6 t，减轻到现在的50～200 kg，缩短试验时间。
採用併聯諧振補償原理，研製瞭智能型交直流耐壓實驗裝置，裝置保證試驗電壓的工頻頻率和波形質量。對被試品的狀態參數（電壓、電流、頻率）進行實時採樣，併可根據試驗要求對電壓波形進行智能分析，打印試驗結果及波形，儀器測量精度為0.5%。整套設備從傳統試驗設備的5～6 t，減輕到現在的50～200 kg，縮短試驗時間。
채용병련해진보상원리，연제료지능형교직류내압실험장치，장치보증시험전압적공빈빈솔화파형질량。대피시품적상태삼수（전압、전류、빈솔）진행실시채양，병가근거시험요구대전압파형진행지능분석，타인시험결과급파형，의기측량정도위0.5%。정투설비종전통시험설비적5～6 t，감경도현재적50～200 kg，축단시험시간。
An intelligent AC/DC withstand voltage test device was developed on the basis of parallel resonance compensa?tion principle. The device ensures the power frequency and the waveform quality of the test voltage. The real?time sampling of state parameters(voltage,current and frequency)for the specimin under test was performed. The intelligent analysis and test result printing for voltage waveform can be conducted according to the experiment request. The detecting precision of the instru?ment is 0.5%. The weight of the whole device was lightened from 5~6 t to 50~200 kg. The experiment duration was shortened.
