电子与封装
電子與封裝
전자여봉장
EIECTRONICS AND PACKAGING
2013年
8期
20-21,39
,共3页
Ultra-FLEX%集成电路%测试%测试系统
Ultra-FLEX%集成電路%測試%測試繫統
Ultra-FLEX%집성전로%측시%측시계통
Ultra-FLEX%IC%testing%test system
在半导体技术高速发展的今天，对集成电路的测试要求越来越高，测试开发的难度、复杂度都在增加，如何应对当前集成电路的测试需求，成为测试开发者需要考虑的问题。Ultra-FLEX测试系统是新一代的测试系统，用以应对当今的测试需求。文章介绍了Ultra-FLEX测试系统的硬件资源，列举了部分模块及其功能和参数；描述了一般集成电路测试开发的流程，并以数字集成电路为例介绍了相关测试内容；介绍了Ultra-FLEX测试系统的软件环境，列举了测试程序构成要素以及各自功能；介绍了Ultra-FLEX测试系统的程序调试环境，测试系统提供的调试工具以及调试方法。
在半導體技術高速髮展的今天，對集成電路的測試要求越來越高，測試開髮的難度、複雜度都在增加，如何應對噹前集成電路的測試需求，成為測試開髮者需要攷慮的問題。Ultra-FLEX測試繫統是新一代的測試繫統，用以應對噹今的測試需求。文章介紹瞭Ultra-FLEX測試繫統的硬件資源，列舉瞭部分模塊及其功能和參數；描述瞭一般集成電路測試開髮的流程，併以數字集成電路為例介紹瞭相關測試內容；介紹瞭Ultra-FLEX測試繫統的軟件環境，列舉瞭測試程序構成要素以及各自功能；介紹瞭Ultra-FLEX測試繫統的程序調試環境，測試繫統提供的調試工具以及調試方法。
재반도체기술고속발전적금천，대집성전로적측시요구월래월고，측시개발적난도、복잡도도재증가，여하응대당전집성전로적측시수구，성위측시개발자수요고필적문제。Ultra-FLEX측시계통시신일대적측시계통，용이응대당금적측시수구。문장개소료Ultra-FLEX측시계통적경건자원，열거료부분모괴급기공능화삼수；묘술료일반집성전로측시개발적류정，병이수자집성전로위례개소료상관측시내용；개소료Ultra-FLEX측시계통적연건배경，열거료측시정서구성요소이급각자공능；개소료Ultra-FLEX측시계통적정서조시배경，측시계통제공적조시공구이급조시방법。
Today, as the semiconductor technology is developing very fast, it requires high level testing, testing development becomes more difficult, more complex, how to satisfy the testing requirement is a question which testing developer need to think. Ultra-FLEX is a new generation test system which is used to test current integrated circuit. This article introduce the hardware of Ultra-FLEX, list some of the options and their function and parameter;describe the general procedure of testing development, and introduce the testing items of digital IC as example;introduce the software environment of Ultra-FLEX, list the content of a testing program and their function;introduce the debugging environment of Ultra-FLEX, the debugging tools provided by the system, and the debugging method.
