电子学报
電子學報
전자학보
ACTA ELECTRONICA SINICA
2013年
7期
1358-1364
,共7页
裴颂伟%李兆麟%李圣龙%魏少军
裴頌偉%李兆麟%李聖龍%魏少軍
배송위%리조린%리골룡%위소군
片上系统%模数转换器%数模转换器%V93000测试仪%性能参数
片上繫統%模數轉換器%數模轉換器%V93000測試儀%性能參數
편상계통%모수전환기%수모전환기%V93000측시의%성능삼수
System-on-a-Chip%ADC%DAC%V93000 ATE%performance parameter
SoC (System-on-a-Chip )芯片设计中,由于芯片测试引脚数目的限制以及基于芯片性能的考虑,通常有一些端口不能进行测试复用的IP(Intellectual Property )核将不可避免地被集成在SoC芯片当中。对于端口非测试复用IP核,由于其端口不能被直接连接到ATE(Automatic Test Equipment )设备的测试通道上,由此,对端口非测试复用IP核的测试将是对SoC芯片进行测试的一个重要挑战。在本文当中,我们分别提出了一种基于V93000测试仪对端口非测试复用ADC (Analog-to-Digital Converter )以及DAC (Digital-to-Analog Converter )IP核的性能参数测试方法。对于端口非测试复用ADC和DAC IP核,首先分别为他们开发测试程序并利用V93000通过SoC芯片的EMIF (External Memory Interface )总线对其进行配置。在对ADC和DAC IP核进行配置以后,就可以通过V93000捕获ADC IP核采样得到的数字代码以及通过V93000采样DAC IP核转换得到的模拟电压值,并由此计算ADC以及DAC IP核的性能参数。实验结果表明,本文分别提出的针对端口非测试复用ADC以及DAC IP核测试方案非常有效。
SoC (System-on-a-Chip )芯片設計中,由于芯片測試引腳數目的限製以及基于芯片性能的攷慮,通常有一些耑口不能進行測試複用的IP(Intellectual Property )覈將不可避免地被集成在SoC芯片噹中。對于耑口非測試複用IP覈,由于其耑口不能被直接連接到ATE(Automatic Test Equipment )設備的測試通道上,由此,對耑口非測試複用IP覈的測試將是對SoC芯片進行測試的一箇重要挑戰。在本文噹中,我們分彆提齣瞭一種基于V93000測試儀對耑口非測試複用ADC (Analog-to-Digital Converter )以及DAC (Digital-to-Analog Converter )IP覈的性能參數測試方法。對于耑口非測試複用ADC和DAC IP覈,首先分彆為他們開髮測試程序併利用V93000通過SoC芯片的EMIF (External Memory Interface )總線對其進行配置。在對ADC和DAC IP覈進行配置以後,就可以通過V93000捕穫ADC IP覈採樣得到的數字代碼以及通過V93000採樣DAC IP覈轉換得到的模擬電壓值,併由此計算ADC以及DAC IP覈的性能參數。實驗結果錶明,本文分彆提齣的針對耑口非測試複用ADC以及DAC IP覈測試方案非常有效。
SoC (System-on-a-Chip )심편설계중,유우심편측시인각수목적한제이급기우심편성능적고필,통상유일사단구불능진행측시복용적IP(Intellectual Property )핵장불가피면지피집성재SoC심편당중。대우단구비측시복용IP핵,유우기단구불능피직접련접도ATE(Automatic Test Equipment )설비적측시통도상,유차,대단구비측시복용IP핵적측시장시대SoC심편진행측시적일개중요도전。재본문당중,아문분별제출료일충기우V93000측시의대단구비측시복용ADC (Analog-to-Digital Converter )이급DAC (Digital-to-Analog Converter )IP핵적성능삼수측시방법。대우단구비측시복용ADC화DAC IP핵,수선분별위타문개발측시정서병이용V93000통과SoC심편적EMIF (External Memory Interface )총선대기진행배치。재대ADC화DAC IP핵진행배치이후,취가이통과V93000포획ADC IP핵채양득도적수자대마이급통과V93000채양DAC IP핵전환득도적모의전압치,병유차계산ADC이급DAC IP핵적성능삼수。실험결과표명,본문분별제출적침대단구비측시복용ADC이급DAC IP핵측시방안비상유효。
IP cores without I/O multiplexing are typically unavoidable to be embedded into SoC due to the necessary consid-erations such as pin constraint and performance optimization during the design stage .Hence ,one of the serious challenges for SoC testing is how to effectively test IP cores without I/O multiplexing because the ports of IP cores without I/O multiplexing cannot be directly connected to the ATE channels .In this paper ,we propose test methods for ADC and DAC IP cores without I/O multiplex-ing using V93000 ATE respectively .In order to test the ADC and DAC IP cores without I/O multiplexing ,test programs are firstly developed and loaded into V93000 to configure the two cores via EMIF bus .Then the digital codes and the analog voltage values re-spectively converted by ADC and DAC IP cores of SoC are captured by V93000 for performance parameter calculation .Experimen-tal results show that the proposed methods are effective .