CAJ | 학술논문

为获得低损伤、稳定性好的感应耦合等离子体(ICP)刻蚀InGaAs探测器台面成型工艺，采用Raman光谱技术和X射线衍射(XRD)技术，初步研究了Cl2/N2气氛刻蚀InGaAs的主要损伤机制，确定以晶格缺陷损伤为主；并采用微波反射光电导衰退(μ-PCD)法对不同处理工艺下表面的缺陷损伤进行了表征和分析，结果表明刻蚀表面湿法腐蚀和硫化的方法可在一定程度上减小表面的缺陷损伤和断键，但是存在一些深层次的缺陷。
위획득저손상、은정성호적감응우합등리자체(ICP)각식InGaAs탐측기태면성형공예，채용Raman광보기술화X사선연사(XRD)기술，초보연구료Cl2/N2기분각식InGaAs적주요손상궤제，학정이정격결함손상위주；병채용미파반사광전도쇠퇴(μ-PCD)법대불동처리공예하표면적결함손상진행료표정화분석，결과표명각식표면습법부식화류화적방법가재일정정도상감소표면적결함손상화단건，단시존재일사심층차적결함。
In order to obtain a method for low damage and steaty mesa structures, the damage mechanism of InGaAs by Cl2/N2 ICP etching was studied in this paper. The surfaces of InGaAs before and after etching was investigated using Raman spectroscopy and X-ray diffraction (XRD) technology. The results indicate that lattice defects are the main damages. The surface damage of different treatment process was characterised and analysed by the method of microwave photoconductivity decay measurement. The results show that the surface defects and broken bonds of etching damage are decreased to a certain extent by wet etching and surface sulfur treatment, but deep defects still cannot be avoided.