光电工程
光電工程
광전공정
OPTO-ELECTRONIC ENGINEERING
2014年
2期
33-39
,共7页
李坤%李辉%刘云杰%梁平%卢小鹏
李坤%李輝%劉雲傑%樑平%盧小鵬
리곤%리휘%류운걸%량평%로소붕
Mura缺陷%亮度不均匀%B样条%曲面拟合%背景抑制
Mura缺陷%亮度不均勻%B樣條%麯麵擬閤%揹景抑製
Mura결함%량도불균균%B양조%곡면의합%배경억제
Mura defect%uneven brightness%B-spline%surface fitting%background suppression
针对机器视觉检测TFT-LCD Mura缺陷时存在的图像整体亮度不均匀、背景复杂等影响检测准确性的问题,提出一种基于B样条曲面拟合的背景抑制方法。在最小二乘法准则的约束下,采用双三次B样条曲面拟合算法拟合出背景,并添加光顺项调整拟合精度,用原始图像减去拟合背景,从而消除亮度不均匀背景对缺陷分割造成的影响。为提高算法速度,对原始图像进行分块拟合,并将双三次B样条函数分解为一元函数求解,减小了计算量,同时避免了对原函数求解时容易出现的病态解问题。实验结果表明,该算法准确、高效。
針對機器視覺檢測TFT-LCD Mura缺陷時存在的圖像整體亮度不均勻、揹景複雜等影響檢測準確性的問題,提齣一種基于B樣條麯麵擬閤的揹景抑製方法。在最小二乘法準則的約束下,採用雙三次B樣條麯麵擬閤算法擬閤齣揹景,併添加光順項調整擬閤精度,用原始圖像減去擬閤揹景,從而消除亮度不均勻揹景對缺陷分割造成的影響。為提高算法速度,對原始圖像進行分塊擬閤,併將雙三次B樣條函數分解為一元函數求解,減小瞭計算量,同時避免瞭對原函數求解時容易齣現的病態解問題。實驗結果錶明,該算法準確、高效。
침대궤기시각검측TFT-LCD Mura결함시존재적도상정체량도불균균、배경복잡등영향검측준학성적문제,제출일충기우B양조곡면의합적배경억제방법。재최소이승법준칙적약속하,채용쌍삼차B양조곡면의합산법의합출배경,병첨가광순항조정의합정도,용원시도상감거의합배경,종이소제량도불균균배경대결함분할조성적영향。위제고산법속도,대원시도상진행분괴의합,병장쌍삼차B양조함수분해위일원함수구해,감소료계산량,동시피면료대원함수구해시용역출현적병태해문제。실험결과표명,해산법준학、고효。
A background suppression method based on B-spline surface fitting was proposed to solve the problem of the accuracy of Mura detection, which is often caused by the uneven brightness and complex background when employing machine vision on Mura detection of TFT-LCD. Under the constraint of least square criterion, bicubic B-spline surface fitting algorithm was deployed to fit the uneven brightness background and a fairing item was added to adjust fitting precision. In order to increase the performance of the proposed algorithm and decrease the calculation time, divided fitting method was used on original image and the bicubic B-spline function was analyzed into one-dimensional functions for efficiently solving. Furthermore, pathological problems caused by solving of the two-dimensional functions could be avoided simultaneously. The effect on the Mura defect segmentation caused by uneven brightness background was eliminated by subtracting the fitted background from the original image. The experimental results show that the proposed method can suppress the uneven brightness background efficiently and Mura defect can be segmented accurately after background suppression.