光电工程
光電工程
광전공정
OPTO-ELECTRONIC ENGINEERING
2014年
2期
12-18
,共7页
颜色测量%分光测色仪%光泽影响%算法修正
顏色測量%分光測色儀%光澤影響%算法脩正
안색측량%분광측색의%광택영향%산법수정
color measurement%spectrophotometer%gloss%algorithm correction
在对相同材质,不同光泽的物体表面进行颜色测量时,为了去除表面光泽对颜色测量产生的影响,多选择漫射照明、8°观察角、包含镜面反射光的照明观测条件。在理想情况下,由于积分球对照明光线的匀化,测量结果不会受到材料表面光泽的影响。但是在实际仪器结构设计中,由于测量结构设计的限制导致相同光谱反射率,不同表面光泽的测试样品颜色测量结果不同。文章从理论上分析了漫射照明、8°观察角、包含镜面反射光的照明观测条件下不同光泽材料表面测量产生误差的原因,设计了一种可以同时测量颜色数据和光泽数据的测量结构,提出了一种根据被测材料表面光泽数据对SCI测量数据进行修正的矫正模型,并设计相关实验进行验证。实验结果证明,应用该矫正模型对测量结构进行修正可以显著减小该测量误差。
在對相同材質,不同光澤的物體錶麵進行顏色測量時,為瞭去除錶麵光澤對顏色測量產生的影響,多選擇漫射照明、8°觀察角、包含鏡麵反射光的照明觀測條件。在理想情況下,由于積分毬對照明光線的勻化,測量結果不會受到材料錶麵光澤的影響。但是在實際儀器結構設計中,由于測量結構設計的限製導緻相同光譜反射率,不同錶麵光澤的測試樣品顏色測量結果不同。文章從理論上分析瞭漫射照明、8°觀察角、包含鏡麵反射光的照明觀測條件下不同光澤材料錶麵測量產生誤差的原因,設計瞭一種可以同時測量顏色數據和光澤數據的測量結構,提齣瞭一種根據被測材料錶麵光澤數據對SCI測量數據進行脩正的矯正模型,併設計相關實驗進行驗證。實驗結果證明,應用該矯正模型對測量結構進行脩正可以顯著減小該測量誤差。
재대상동재질,불동광택적물체표면진행안색측량시,위료거제표면광택대안색측양산생적영향,다선택만사조명、8°관찰각、포함경면반사광적조명관측조건。재이상정황하,유우적분구대조명광선적균화,측량결과불회수도재료표면광택적영향。단시재실제의기결구설계중,유우측량결구설계적한제도치상동광보반사솔,불동표면광택적측시양품안색측량결과불동。문장종이론상분석료만사조명、8°관찰각、포함경면반사광적조명관측조건하불동광택재료표면측양산생오차적원인,설계료일충가이동시측량안색수거화광택수거적측량결구,제출료일충근거피측재료표면광택수거대SCI측량수거진행수정적교정모형,병설계상관실험진행험증。실험결과증명,응용해교정모형대측량결구진행수정가이현저감소해측량오차。
When the surface color of the same material and different gloss objects is measured, in order to remove the color measurement impact caused by the surface gloss, the diffuse illumination, the viewing angle of 8-degree illumination and specular component included illumination viewing conditions are mostly chosen. Ideally, because of the homogenization effect of integrating sphere on illumination light, the measurement result is not affected by the surface gloss. However, in the real instrument design, owing to the constraints in measuring structural design, the color measurement results of the test samples with the same spectral reflectance and different surface gloss are different. This paper theoretically analyzes the cause of the deviation in the illumination viewing condition of the diffuse illumination, the viewing angle of 8-degree illumination and specular component included illumination, when measuring the material surface color of different gloss. This paper also designs a measurement structure which can simultaneously measure the data of color and gloss, presents a correction model which can modify the SCI measured data according to the surface gloss data of the test sample, and then designs relevant experiments to test and verify. The experimental results show that, using the correction model for modifying the measurement structure, the measurement error can be significantly reduced.