红外与激光工程
紅外與激光工程
홍외여격광공정
INFRARED AND LASER ENGINEERING
2014年
5期
1582-1586
,共5页
三维变形测试%双曝光全息干涉术%数字全息%四步数字相移法
三維變形測試%雙曝光全息榦涉術%數字全息%四步數字相移法
삼유변형측시%쌍폭광전식간섭술%수자전식%사보수자상이법
three-dimensional deformation tests%double exposure holographic interferometry%digital holography%four-step digital phase shifting method
全息三维变形测试在军事、工业测试中有重要意义,而传统的全息术由于记录、显影、定影、再现、复位等条件使其应用受到限制。文中应用CCD实现了数字全息,不仅避免了传统全息显影、定影等过程,也避免了全息材料非线性记录等缺点,并基于双曝光全息干涉术和四步相移法原理,实现了数字相移,取代了传统的应用压电位移器等机械相移法,实现了物体的三维变形测试。由物体变形的二维等高线图和三维立体图,可判读物体变形的大小、变形的方向和变形的形状。大量的实验表明,该方法不仅简化了全息干涉测试的光学装置,而且具有操作简单,测试精度高,其精度容易达到1/10波长。
全息三維變形測試在軍事、工業測試中有重要意義,而傳統的全息術由于記錄、顯影、定影、再現、複位等條件使其應用受到限製。文中應用CCD實現瞭數字全息,不僅避免瞭傳統全息顯影、定影等過程,也避免瞭全息材料非線性記錄等缺點,併基于雙曝光全息榦涉術和四步相移法原理,實現瞭數字相移,取代瞭傳統的應用壓電位移器等機械相移法,實現瞭物體的三維變形測試。由物體變形的二維等高線圖和三維立體圖,可判讀物體變形的大小、變形的方嚮和變形的形狀。大量的實驗錶明,該方法不僅簡化瞭全息榦涉測試的光學裝置,而且具有操作簡單,測試精度高,其精度容易達到1/10波長。
전식삼유변형측시재군사、공업측시중유중요의의,이전통적전식술유우기록、현영、정영、재현、복위등조건사기응용수도한제。문중응용CCD실현료수자전식,불부피면료전통전식현영、정영등과정,야피면료전식재료비선성기록등결점,병기우쌍폭광전식간섭술화사보상이법원리,실현료수자상이,취대료전통적응용압전위이기등궤계상이법,실현료물체적삼유변형측시。유물체변형적이유등고선도화삼유입체도,가판독물체변형적대소、변형적방향화변형적형상。대량적실험표명,해방법불부간화료전식간섭측시적광학장치,이차구유조작간단,측시정도고,기정도용역체도1/10파장。
Holographic three-dimensional deformation test has important significance in the military, industrial test, however its applications are limited because of the requirements of traditional holographic recording, development, fixing, reconstruction and home position. In this paper, applying the charge-coupled device(CCD) digital holography was realized. It avoided not only the developing, fixing processes of traditional hologram recording material, but also the shortcoming of nonlinear recording of holographic material. Based on double exposure holographic interferometry and four-step phase shift method principle the digital phase shift was achieved, replaced the traditional mechanical phase shift method with piezoelectric translator, and the 3D deformation of an object was tested. From the 2D contour map and 3D plot of object deformation, the size, shape, and deformation direction of the deformed object could be interpreted. A lot of experiment results show that these method can not only simplify the optical layout of holographic interference testing, but also easy operate and increase measure precision. The precision can be up to 1/10 wavelength.