核电子学与探测技术
覈電子學與探測技術
핵전자학여탐측기술
NUCLEAR ELECTRONICS & DETECTION TECHNOLOGY
2013年
12期
1538-1542
,共5页
李军%杨国洪%韦敏习%侯立飞%易涛%刘慎业
李軍%楊國洪%韋敏習%侯立飛%易濤%劉慎業
리군%양국홍%위민습%후립비%역도%류신업
X射线衍射仪%PET晶体%高阶衍射效率
X射線衍射儀%PET晶體%高階衍射效率
X사선연사의%PET정체%고계연사효솔
X-ray diffractometer%Pentaerythritol crystal%high order diffraction
基于实验室X射线衍射仪,利用Cu X射线管作为光源,对PET晶体的高阶衍射效率进行标定。通过选取适宜厚度的滤片,控制X射线管电压,抑制Cu Kβ及轫致辐射,将Cu Kα单能化。实验结果表明,在Cu Kα能点,PET晶体的二阶积分衍射效率是一阶的14.36%,三阶积分衍射效率是一阶的4.07%;Cu Kα1最大峰值比,二阶衍射为一阶的7.7%,三阶衍射为一阶的1.3%。该标定方法快速高效、方便灵活,为X射线光谱的定量化测量提供了数据支撑,是同步辐射晶体标定的有力补充。
基于實驗室X射線衍射儀,利用Cu X射線管作為光源,對PET晶體的高階衍射效率進行標定。通過選取適宜厚度的濾片,控製X射線管電壓,抑製Cu Kβ及軔緻輻射,將Cu Kα單能化。實驗結果錶明,在Cu Kα能點,PET晶體的二階積分衍射效率是一階的14.36%,三階積分衍射效率是一階的4.07%;Cu Kα1最大峰值比,二階衍射為一階的7.7%,三階衍射為一階的1.3%。該標定方法快速高效、方便靈活,為X射線光譜的定量化測量提供瞭數據支撐,是同步輻射晶體標定的有力補充。
기우실험실X사선연사의,이용Cu X사선관작위광원,대PET정체적고계연사효솔진행표정。통과선취괄의후도적려편,공제X사선관전압,억제Cu Kβ급인치복사,장Cu Kα단능화。실험결과표명,재Cu Kα능점,PET정체적이계적분연사효솔시일계적14.36%,삼계적분연사효솔시일계적4.07%;Cu Kα1최대봉치비,이계연사위일계적7.7%,삼계연사위일계적1.3%。해표정방법쾌속고효、방편령활,위X사선광보적정양화측량제공료수거지탱,시동보복사정체표정적유력보충。
On the automatic X-ray diffractometer ( XRD) ,based on the stability and precision control of θand 2θ goniometer , special plane crystal holder was made .Bremsstrahlung and Cu Kβline are attenuated for 5 or-ders by 40 μm-thick pure Nickel filter in 15 kilo-voltage and 20mA supply to X -ray Cu tube, X-ray source of Cu target is to be Cu Kαmonochromatic source ,transmission coefficient of Nickel filter is the criterion of Cu Kαmonochromatic source.For X-ray Pentaerythritol(002) crystal,integral diffraction coefficient of 1-3 order diffraction on Cu Kαenergy were calibrated .The results show that the 2nd order and the 3rd order is only 14.36%and 4.07%, the Cu Kα1 intensity ratio of 2nd order and the 3rd order is only 7.7%and 1.3%, comparing the 1st order diffraction.This kind of calibration is efficient and convenient on XRD in common labo-ratory .