CAJ | 학술논문

根据新形势下存储器单粒子试验的特点，基于FPGA和虚拟仪器相结合的方式设计了一款针对存储器单粒子效应的测试系统。该系统改进了传统测试系统中试验数据的回传方式，能够较好地监测和应对单粒子闩锁（ SEL）效应，并能够将单粒子瞬态效应（ SET）和单粒子翻转（ SEU）区分出来。该测试系统还可以根据存储器的不同进行灵活地配置，并经过实际的单粒子效应测试验证了本系统的可靠性。
근거신형세하존저기단입자시험적특점，기우FPGA화허의의기상결합적방식설계료일관침대존저기단입자효응적측시계통。해계통개진료전통측시계통중시험수거적회전방식，능구교호지감측화응대단입자산쇄（ SEL）효응，병능구장단입자순태효응（ SET）화단입자번전（ SEU）구분출래。해측시계통환가이근거존저기적불동진행령활지배치，병경과실제적단입자효응측시험증료본계통적가고성。
The memory cells fabricated with smaller technology node are faster and have different single -event effect attribute than the previous generation .A new memory testing system has been designed to fulfill the de-mand to test the memory's single-event effect completely and efficiently based on the FPGA and the LabVIEW virtual instrument .The testing system can be configured flexibly according to the memory under test , and has been verified in real single -event testing .