电子工艺技术
電子工藝技術
전자공예기술
ELECTRONICS PROCESS TECHNOLOGY
2014年
2期
84-87
,共4页
气相清洗%硅裸芯片%砷化镓裸芯片%金丝性能
氣相清洗%硅裸芯片%砷化鎵裸芯片%金絲性能
기상청세%규라심편%신화가라심편%금사성능
Vapor cleaning%Si bare chips%GaAs bare chips%Gold wire
军用和民用微型电子产品的MCM、HIC等复杂混合电路正在越来越多地采用裸芯片,然而,裸芯片由于尺寸小、电路密集、焊盘间距小等原因,在进行组装的过程中一旦有微量的污染物出现,就会对裸芯片的应用造成较大影响。气相清洗通过清洗溶剂蒸汽在组件表面冷凝,形成液体滴下带走污染物,避免了传统的通过机械力、超声振动等清洗方式对裸芯片造成的不可修复的损伤。对限幅二极管砷化镓裸芯片、硅基裸芯片进行气相清洗,有效除去裸芯片表面的污染物,具有无损高效的特点。
軍用和民用微型電子產品的MCM、HIC等複雜混閤電路正在越來越多地採用裸芯片,然而,裸芯片由于呎吋小、電路密集、銲盤間距小等原因,在進行組裝的過程中一旦有微量的汙染物齣現,就會對裸芯片的應用造成較大影響。氣相清洗通過清洗溶劑蒸汽在組件錶麵冷凝,形成液體滴下帶走汙染物,避免瞭傳統的通過機械力、超聲振動等清洗方式對裸芯片造成的不可脩複的損傷。對限幅二極管砷化鎵裸芯片、硅基裸芯片進行氣相清洗,有效除去裸芯片錶麵的汙染物,具有無損高效的特點。
군용화민용미형전자산품적MCM、HIC등복잡혼합전로정재월래월다지채용라심편,연이,라심편유우척촌소、전로밀집、한반간거소등원인,재진행조장적과정중일단유미량적오염물출현,취회대라심편적응용조성교대영향。기상청세통과청세용제증기재조건표면냉응,형성액체적하대주오염물,피면료전통적통과궤계력、초성진동등청세방식대라심편조성적불가수복적손상。대한폭이겁관신화가라심편、규기라심편진행기상청세,유효제거라심편표면적오염물,구유무손고효적특점。
Military and consumer electronic product makes bare chips more and more directly apply to MCM, HIC and other complex mixing circuit. However, because of the small size and tight pitch of bare chip, the contaminants on bare chip from the process of mounted and rework process has great influence on circuit performance, and must be removed. Vapor cleaning let solvent rise in a vapor state, and return to liquid when it encounters a cold module, discharge the contaminants, make bare chip avoid the irreparable damage caused by mechanical force, ultrasonic vibration cleaning methods. Vapor cleaning which was used to Si and GaAs chips can effectively and non-destructively remove contaminants on bare chip surface.