CAJ | 학술논문

透射电子显微镜作为观察材料微结构的主要手段之一，其显微图像可直观揭示材料微结构信息和空间分布情况。振幅衬度是一种重要的显微成像衬度机制，基于振幅衬度能够使显微像揭示材料的微结构特征。尽管显微像衬度的产生都来源于电子波的振幅，但是振幅衬度像还可以进一步化分为质厚衬度像和衍射衬度像。由于像衬度形成机理的差异，质厚衬度像和衍射衬度像中所显示的微结构细节有明显不同。本文介绍了如何在透射电镜观察中实现质厚衬度成像和衍射衬度成像，及其相互转换的实验方法和操作技术细节。利用透射电镜的不同成像衬度模式能够在样品的同一视场中观察到更多的材料结构细节，可以在多层次和不同尺度上获得更丰富的微结构信息。
투사전자현미경작위관찰재료미결구적주요수단지일，기현미도상가직관게시재료미결구신식화공간분포정황。진폭츤도시일충중요적현미성상츤도궤제，기우진폭츤도능구사현미상게시재료적미결구특정。진관현미상츤도적산생도래원우전자파적진폭，단시진폭츤도상환가이진일보화분위질후츤도상화연사츤도상。유우상츤도형성궤리적차이，질후츤도상화연사츤도상중소현시적미결구세절유명현불동。본문개소료여하재투사전경관찰중실현질후츤도성상화연사츤도성상，급기상호전환적실험방법화조작기술세절。이용투사전경적불동성상츤도모식능구재양품적동일시장중관찰도경다적재료결구세절，가이재다층차화불동척도상획득경봉부적미결구신식。
Because transmission electron microscope (T EM ) can be used to show the details of micro-structure of various materials directly ,T EM has become one of the most important instruments for materi-al ultrafine structure study .Amplitude contrast is important for TEM images ,due to the information shown in TEM images resulting from such contrast .Usually ,amplitude contrast divide into mass-thick-ness contrast and diffraction contrast ,although mass-thickness contrast and diffraction contrast are based on the amplitude of electron wave ,because of the difference between their mechanisms ,the information in TEM images based on these two contrasts are different .In this article ,the techniques of imaging with mass-thickness contrast and diffraction contrast respectively are described in details .More information a-bout the microstructures in the same position can be revealed by combining the TEM images with different contrasts .