CAJ | 학술논문

为了保证在高温条件下，正确使用高频硅PNP晶体管3CG120，文中对3CG120在不同温度段的失效机理进行了研究。通过对硅PNP型晶体管3CG120进行170-340℃温度范围内序进应力加速寿命试验，发现在170～240℃．240-290℃，以及290-340℃分别具有不同的失效机理，并通过分析得到了保证加速寿命试验中与室温相同的失效机理温度应力范围。
위료보증재고온조건하，정학사용고빈규PNP정체관3CG120，문중대3CG120재불동온도단적실효궤리진행료연구。통과대규PNP형정체관3CG120진행170-340℃온도범위내서진응력가속수명시험，발현재170～240℃．240-290℃，이급290-340℃분별구유불동적실효궤리，병통과분석득도료보증가속수명시험중여실온상동적실효궤리온도응력범위。
To use the 3CG120 correctly under high temperature, the papre studied the failure mechanism under high temperaure. In the experiments, silicon samples, 3CG120 transistor was subjected to temperature progress stress form 443 to 613K. After the test, failure mechanisms in different temperature ranges were studied. And the failure mechanism in different ranges are unconsistant. And the tempreture, at which the failure mechanisms will change from room temperature, was accqured.