红外与激光工程
紅外與激光工程
홍외여격광공정
INFRARED AND LASER ENGINEERING
2014年
3期
812-817
,共6页
Dammann光栅%亚波长结构%衍射效率%均匀性
Dammann光柵%亞波長結構%衍射效率%均勻性
Dammann광책%아파장결구%연사효솔%균균성
Dammann grating%sub-wavelength structure%diffraction efficiency%uniformity
论文基于严格耦合波理论(Rigorous Coupled-Wave Analysis, RCWA),并采用遗传算法进行优化,设计并制作了一种具有高衍射效率的亚波长结构Dammann光栅。光栅的分束比为1×11,最小特征尺寸为0.95μm,衍射效率设计值达到95%,优于传统Dammann光栅约15%,且均匀性设计值小于2%。论文采用电子束光刻直写技术和反应离子刻蚀技术在石英基底上制作出亚波长结构图形。实验结果表明,电子束扫描曝光可以获得纳米级的图形分辨率。对石英基底的反应离子刻蚀中,射频功率、工作气压及气体流量均对刻蚀速率和栅线的表面形貌产生不同程度的影响,论文主要针对该问题进行了讨论。同时,论文也对电子束光刻直写过程中产生的线宽误差因素进行了分析。
論文基于嚴格耦閤波理論(Rigorous Coupled-Wave Analysis, RCWA),併採用遺傳算法進行優化,設計併製作瞭一種具有高衍射效率的亞波長結構Dammann光柵。光柵的分束比為1×11,最小特徵呎吋為0.95μm,衍射效率設計值達到95%,優于傳統Dammann光柵約15%,且均勻性設計值小于2%。論文採用電子束光刻直寫技術和反應離子刻蝕技術在石英基底上製作齣亞波長結構圖形。實驗結果錶明,電子束掃描曝光可以穫得納米級的圖形分辨率。對石英基底的反應離子刻蝕中,射頻功率、工作氣壓及氣體流量均對刻蝕速率和柵線的錶麵形貌產生不同程度的影響,論文主要針對該問題進行瞭討論。同時,論文也對電子束光刻直寫過程中產生的線寬誤差因素進行瞭分析。
논문기우엄격우합파이론(Rigorous Coupled-Wave Analysis, RCWA),병채용유전산법진행우화,설계병제작료일충구유고연사효솔적아파장결구Dammann광책。광책적분속비위1×11,최소특정척촌위0.95μm,연사효솔설계치체도95%,우우전통Dammann광책약15%,차균균성설계치소우2%。논문채용전자속광각직사기술화반응리자각식기술재석영기저상제작출아파장결구도형。실험결과표명,전자속소묘폭광가이획득납미급적도형분변솔。대석영기저적반응리자각식중,사빈공솔、공작기압급기체류량균대각식속솔화책선적표면형모산생불동정도적영향,논문주요침대해문제진행료토론。동시,논문야대전자속광각직사과정중산생적선관오차인소진행료분석。
In this paper, a high-diffraction efficiency Dammann grating with sub-wavelength structure was designed and prepared based on the Rigorous Coupled-Wave Analysis (RCWA) theory and optimized by the genetic algorithm. The array number of diffractive spots was 11 and the minimum feature size achieved 0.95μm. The design value of diffraction efficiency can achieves 95%, around 15% more than conventional Dammann grating while the uniformity can be less than 2%. By using Electron Beam Direct Writing and Reactive Ion Etching, the sub-wavelength structure was patterned on the silica basement. The experimental results show that the sub-wavelength structure with nanometer resolution can be patterned by electron beam scanning exposure. In reactive ion etching, the etching rate and the grating line-shape can be affected by radio frequency (RF) power, system pressure and gas flow, and the line-width error in Electron Beam Direct Writing was also analyzed.