CAJ | 학술논문

目的：应用基于高分辨 MRI 结构成像（sMRI）、表面基础形态测量学（SBM）的皮层测量方法，分析幼儿148个脑区的皮层厚度（CT）、皮层表面积（SA）及平均曲率（AV）等参数，探讨皮层厚度等皮层形态学参数与幼儿智力发育水平的相关性。方法：对13例健康幼儿受试者进行智力发育水平评分。采用 Siemens 3．0T MR 机对所有纳入对象进行高分辨率的3D T1脑结构图像采集。使用基于 SBM 的方法获取每个被试者148个脑区的 CT、SA、AV 等参数，逐一对每个脑区皮层参数与幼儿智力发育水平评分进行相关性分析。结果：对受试者大脑半球皮层参数与智力量表评分的相关性分析中发现，SA 与智力量表评分存在相关性的脑区集中于语言及社交相关区，即额下回脑沟局部区域，大部分呈负相关，如右脑额下回 SA 与量表中适应性评分的相关系数 r＝-0．646（P ＝0．017），与量表中语言评分的相关系数值 r ＝-0．576（P ＝0．039）；AV 与智力量表评分存在相关性的脑区集中于视听、高级整合功能区的颞下回及顶下区，大部分呈负相关，如颞下回 AV 与量表中精细动作评分的相关系数 r＝-0．716（P ＝0．002）；而 CT 与智力量表评分相关的脑区主要为语言区及与人脸识别相关的侧副横沟前部脑区，呈负相关，如右脑侧副横沟前部 CT 与量表中语言评分的 r 值为-0．765（P ＝0．002）。结论：基于高分辨率 MRI 并采用 SBM 测量的幼儿皮层参数与基于智力量表的幼儿智力评分间存在相关性的脑区分布比较广泛，由此可知幼儿大脑结构发育受内在生理因素影响，这与幼儿的智力发育水平、社会适应能力有直接关系。利用这种方法可以对幼儿脑皮层结构进行评估，并可进一步推测幼儿的基本发育状况。
목적：응용기우고분변 MRI 결구성상（sMRI）、표면기출형태측량학（SBM）적피층측량방법，분석유인148개뇌구적피층후도（CT）、피층표면적（SA）급평균곡솔（AV）등삼수，탐토피층후도등피층형태학삼수여유인지력발육수평적상관성。방법：대13례건강유인수시자진행지력발육수평평분。채용 Siemens 3．0T MR 궤대소유납입대상진행고분변솔적3D T1뇌결구도상채집。사용기우 SBM 적방법획취매개피시자148개뇌구적 CT、SA、AV 등삼수，축일대매개뇌구피층삼수여유인지력발육수평평분진행상관성분석。결과：대수시자대뇌반구피층삼수여지역량표평분적상관성분석중발현，SA 여지역량표평분존재상관성적뇌구집중우어언급사교상관구，즉액하회뇌구국부구역，대부분정부상관，여우뇌액하회 SA 여량표중괄응성평분적상관계수 r＝-0．646（P ＝0．017），여량표중어언평분적상관계수치 r ＝-0．576（P ＝0．039）；AV 여지역량표평분존재상관성적뇌구집중우시은、고급정합공능구적섭하회급정하구，대부분정부상관，여섭하회 AV 여량표중정세동작평분적상관계수 r＝-0．716（P ＝0．002）；이 CT 여지역량표평분상관적뇌구주요위어언구급여인검식별상관적측부횡구전부뇌구，정부상관，여우뇌측부횡구전부 CT 여량표중어언평분적 r 치위-0．765（P ＝0．002）。결론：기우고분변솔 MRI 병채용 SBM 측량적유인피층삼수여기우지역량표적유인지력평분간존재상관성적뇌구분포비교엄범，유차가지유인대뇌결구발육수내재생리인소영향，저여유인적지력발육수평、사회괄응능력유직접관계。이용저충방법가이대유인뇌피층결구진행평고，병가진일보추측유인적기본발육상황。
Objective:Using high resolution MRI structural images (sMRI),surface-based morphometry (SBM)for cortex measurement,to analyze the parameters including cortical thickness (CT),surface area (SA)and average curvature (AV)148 cerebral regions,and to study the relationship of cortical morphological parameters (e.g.cortical thickness)and level of intelligence development in infants.Methods:13 healthy infants were included in the study,their level of intelligence development was evaluated.A siemens 3.0T MR scanner was used to acquire the high resolution 3D T1 WI structural images of brain.The parameters including CT,SA,AV acquired in 148 cerebral regions based on SBM were obtained,the correla-tion of each cortex parameter and the level of intelligence development was analyzed.Results:After analyzing the cortex pa-rameters of all cerebral regions and correlated with intelligence development level scale,it was found that correlation of SA and intelligence development level scores were more concentrated at language and social related regions,ie,gyrus frontalis inferior sulcus region,mostly showed negative correlation.For example,the SA of right gyrus frontalis inferior and the cor-related score coefficient was r=0.646 (P =0.017);the correlated coefficient with the language score was r =0.576 (P =0.039);the cerebral region showed AV correlated with intelligence score was concentrated at gyrus temporalis inferior and parietal inferior,mostly showed negative correlation,for example,the correlated coefficient of AV in gyrus temposalis inferi-or and fine action score was r=0.716 (P =0.002);the correlated region of CT and intelligence was mainly in the regions of language and recognition of human face,which was the cerebral region anterior to sulcus collateralis,showing negative cor-relation.For example,CT anterior to right sulcus collateralis related to language score,r = -0.765 (P =0.002).Conclu-sion:Based on high resolution MRI,taking infant cortex parameters measured by SBM and correlated with intelligence score evaluation,the correlated cerebral regions were widely distributed.Therefore,it can be understand that the development of infant cerebral structures are influenced by intrinsic physiologic factors,which have direct relationship with their intelligence development level,social adaptive capacity.Thus,this method can be used to evaluate cortical structure of infant brain and infer their basic developmental situation.