高电压技术
高電壓技術
고전압기술
HIGH VOLTAGE ENGINEERING
2012年
9期
2322-2328
,共7页
满梦华%刘尚合%常小龙%巨政权%褚杰
滿夢華%劉尚閤%常小龍%巨政權%褚傑
만몽화%류상합%상소룡%거정권%저걸
电磁防护%电磁防护仿生%静电放电%可演化数字电路%组合逻辑电路%抗扰度测试
電磁防護%電磁防護倣生%靜電放電%可縯化數字電路%組閤邏輯電路%抗擾度測試
전자방호%전자방호방생%정전방전%가연화수자전로%조합라집전로%항우도측시
electromagnetic protection%electromagnetic protection bionics%electrostatic discharge%evolvable digital circuits%combinational circuits%immunity test
为研究可演化组合逻辑电路对静电放电的抗扰特性,提出了一种基于Cartesian模型和虚拟重配置技术的可演化组合电路系统模型,按照静电放电抗扰度测试标准IEC 61000-4-2分析了电路逻辑功能的受扰规律,归纳为单极性逻辑翻转和瞬态逻辑击穿2种故障模型。利用故障注入的方法模拟静电放电干扰环境,在故障节点比例逐渐增加的条件下进行了功能电路的演化设计试验。结果表明:当静电干扰事件较少时,演化电路可以快速稳定的演化生成功能完备的数字电路;当静电干扰事件频发且造成大量逻辑单元受扰时,其仍能演化生成适应度达0.9的功能电路。因此,可演化组合逻辑电路在逐渐恶劣的静电放电干扰环境下表现出高可靠的抗扰特性。
為研究可縯化組閤邏輯電路對靜電放電的抗擾特性,提齣瞭一種基于Cartesian模型和虛擬重配置技術的可縯化組閤電路繫統模型,按照靜電放電抗擾度測試標準IEC 61000-4-2分析瞭電路邏輯功能的受擾規律,歸納為單極性邏輯翻轉和瞬態邏輯擊穿2種故障模型。利用故障註入的方法模擬靜電放電榦擾環境,在故障節點比例逐漸增加的條件下進行瞭功能電路的縯化設計試驗。結果錶明:噹靜電榦擾事件較少時,縯化電路可以快速穩定的縯化生成功能完備的數字電路;噹靜電榦擾事件頻髮且造成大量邏輯單元受擾時,其仍能縯化生成適應度達0.9的功能電路。因此,可縯化組閤邏輯電路在逐漸噁劣的靜電放電榦擾環境下錶現齣高可靠的抗擾特性。
위연구가연화조합라집전로대정전방전적항우특성,제출료일충기우Cartesian모형화허의중배치기술적가연화조합전로계통모형,안조정전방전항우도측시표준IEC 61000-4-2분석료전로라집공능적수우규률,귀납위단겁성라집번전화순태라집격천2충고장모형。이용고장주입적방법모의정전방전간우배경,재고장절점비례축점증가적조건하진행료공능전로적연화설계시험。결과표명:당정전간우사건교소시,연화전로가이쾌속은정적연화생성공능완비적수자전로;당정전간우사건빈발차조성대량라집단원수우시,기잉능연화생성괄응도체0.9적공능전로。인차,가연화조합라집전로재축점악렬적정전방전간우배경하표현출고가고적항우특성。
In order to investigate the anti-electrostatic discharge { ESD} interference characteristics of evolvable combinational circuits, we proposed a general evolvable model of digital circuits combining virtual reconfigurable circuits' technology with the Cartesian genetic programming ideas. ESD electromagnetic pulse effect experiments were carried out based on IEC 61000-4-2. Thereby,the mechanisms of different interference patterns were analyzed and divided into two types, single polar upsets and transient logical breakdown. Evolution experiments were also carried out when increasing the number of faults,in which the ESD interference environment was simulated by using fault-injection method. The experimental results show that the evolvable digital circuits are immune to low-level fault nodes percentage range. And the circuit can still maintain a fitness of approximately 0.9 even with higher fault node percentages under frequent ESD interferences. It is concluded that the anti-interference ability of evolvable digital circuits is highly reliable.