沈阳化工大学学报
瀋暘化工大學學報
침양화공대학학보
JOURNAL OF SHENYANG INSTITUTE OF CHEMICAL TECHNOLOGY
2012年
1期
53-56,62
,共5页
王慧华%孙树臣%王德永%涂赣峰%马伟民%郭卓%曹大力%马雷
王慧華%孫樹臣%王德永%塗贛峰%馬偉民%郭卓%曹大力%馬雷
왕혜화%손수신%왕덕영%도공봉%마위민%곽탁%조대력%마뢰
碳化硼%球磨%粒度分布%SEM分析
碳化硼%毬磨%粒度分佈%SEM分析
탄화붕%구마%립도분포%SEM분석
boron carbide%milling%particle size distribution curve%SEM analysis
主要研究球磨因素对碳化硼粒度分布的影响,并考察游离碳含量随球磨时间的变化规律.实验结果表明:随着球磨时间增加,碳化硼粒径分布曲线向粒径小的方向移动,当球磨时间达到60 h,粉体粒径细化程度减缓,继续球磨可进一步提高超细颗粒含量;当球磨时间达到一定程度,不同的球料比对粉体粒径分布曲线影响较小;游离碳含量随着球磨时间增加而提高,在20~40 h碳含量增加显著,之后增加缓慢;SEM电镜显示球磨前后粉体显微形貌发生显著变化;XRD分析显示球磨60 h后粉体中出现很强的游离碳衍射峰.
主要研究毬磨因素對碳化硼粒度分佈的影響,併攷察遊離碳含量隨毬磨時間的變化規律.實驗結果錶明:隨著毬磨時間增加,碳化硼粒徑分佈麯線嚮粒徑小的方嚮移動,噹毬磨時間達到60 h,粉體粒徑細化程度減緩,繼續毬磨可進一步提高超細顆粒含量;噹毬磨時間達到一定程度,不同的毬料比對粉體粒徑分佈麯線影響較小;遊離碳含量隨著毬磨時間增加而提高,在20~40 h碳含量增加顯著,之後增加緩慢;SEM電鏡顯示毬磨前後粉體顯微形貌髮生顯著變化;XRD分析顯示毬磨60 h後粉體中齣現很彊的遊離碳衍射峰.
주요연구구마인소대탄화붕립도분포적영향,병고찰유리탄함량수구마시간적변화규률.실험결과표명:수착구마시간증가,탄화붕립경분포곡선향립경소적방향이동,당구마시간체도60 h,분체립경세화정도감완,계속구마가진일보제고초세과립함량;당구마시간체도일정정도,불동적구료비대분체립경분포곡선영향교소;유리탄함량수착구마시간증가이제고,재20~40 h탄함량증가현저,지후증가완만;SEM전경현시구마전후분체현미형모발생현저변화;XRD분석현시구마60 h후분체중출현흔강적유리탄연사봉.
Boron carbide powders show wide application advantages in the fields of wear-resistant materials and high-hardness ceramics.The ball milling technologies have strong effect on the particle size of boron carbide.The influence of milling factors on particle size distribution of boron carbide and the content of free C with increasing milling time were investigated in this paper.The results show that the particle size distribution curve of boron carbide shifted to small size direction with increasing milling time;the refinement slowed down when after milling for 60 h and the concentration of ultrafine particles could be improved with further milling.The different ball-to-powder mass ratio had slight effect on particle size distribution curve of boron carbide when the milling time reached a certain level.The content of free C increased significantly in the range of 20~40 h and became marginally after further milling.The morphologies of the starting material and milled powder were observed by scanning electronic microscopy.X-ray diffraction showed that some strong diffractions of free C were detected after milling for 60 h.