电子与封装
電子與封裝
전자여봉장
EIECTRONICS AND PACKAGING
2012年
3期
1-5,24
,共6页
刘中柱%徐春广%郭祥辉%赵新玉%杨柳
劉中柱%徐春廣%郭祥輝%趙新玉%楊柳
류중주%서춘엄%곽상휘%조신옥%양류
超声显微镜%全波采集%电子封装%无损检测
超聲顯微鏡%全波採集%電子封裝%無損檢測
초성현미경%전파채집%전자봉장%무손검측
scanning acoustic microscopy%electronic package%full-wave acquisition%non-destructive testing
电子封装内部缺陷的尺度微小,引脚焊接的间距也很小,传统检测方法很难对其进行检测。超声显微技术利用聚焦高频超声来进行检测,能对试样表面、亚表面及其内部一定深度内的细微结构进行显微成像,可用来检测电子封装和评估焊接质量。文章采用高速数据采集卡、高频超声聚焦换能器、宽频脉冲收发仪与高精度运动系统,研发了一套超声显微镜系统。该系统具有较高的精度,功能基本完善,造价相对低廉,能进行全时域波形采集与存储。实验结果表明该系统能检测出电子封装内的微细缺陷,可用来评估引脚的焊接质量。
電子封裝內部缺陷的呎度微小,引腳銲接的間距也很小,傳統檢測方法很難對其進行檢測。超聲顯微技術利用聚焦高頻超聲來進行檢測,能對試樣錶麵、亞錶麵及其內部一定深度內的細微結構進行顯微成像,可用來檢測電子封裝和評估銲接質量。文章採用高速數據採集卡、高頻超聲聚焦換能器、寬頻脈遲收髮儀與高精度運動繫統,研髮瞭一套超聲顯微鏡繫統。該繫統具有較高的精度,功能基本完善,造價相對低廉,能進行全時域波形採集與存儲。實驗結果錶明該繫統能檢測齣電子封裝內的微細缺陷,可用來評估引腳的銲接質量。
전자봉장내부결함적척도미소,인각한접적간거야흔소,전통검측방법흔난대기진행검측。초성현미기술이용취초고빈초성래진행검측,능대시양표면、아표면급기내부일정심도내적세미결구진행현미성상,가용래검측전자봉장화평고한접질량。문장채용고속수거채집잡、고빈초성취초환능기、관빈맥충수발의여고정도운동계통,연발료일투초성현미경계통。해계통구유교고적정도,공능기본완선,조개상대저렴,능진행전시역파형채집여존저。실험결과표명해계통능검측출전자봉장내적미세결함,가용래평고인각적한접질량。
The size of defects in electronic package's is micro scale,also the space between welding pins is crowd,so that it difficult to inspect it with traditional testing method.Scanning acoustic microscopy(SAM)with high-frequency focused ultrasound can be used to get deep insight on the micro structure.In this paper,an complete SAM system has been developed including a high-speed data acquisition card,high-frequency ultrasonic focus transducers,a broad band pulse transmitter/receiver,and a high-precision motion system.so this SAM system has some features like high accuracy,high-performance and low cost.Also several advanced non-destructive techniques are accomplished such as full-wave sampling,storing,and dynamical imaging.The inspection results on electronic packages proved that this SAM system can be a useful tool to find electronic package's inner micro defects and evaluate the welding quality of the pins.