CAJ | 학술논문

特征频率fT是数字晶体管的一项重要参数。文章叙述了普通晶体管特征频率fT的测试原理,并从模拟数字晶体管的等效电路着手,通过理论推导,深入分析了fT产生测试误差甚至无法测量的原因。指出基极串联电阻的接入破坏了基极注入信号必须是恒流的测试条件;基极-发射极并联电阻的接入对测试信号起到了分流作用。在这两方面共同作用下,经被测管放大后的集电极信号减小,导致增益下降,必然会产生很大的测试误差。同时文中进行了一系列的试验,与分析结果相符合,并分别给出了串联电阻和并联电阻对fT影响程度的具体数据及曲线图,可为数字晶体管的生产厂商和使用单位的有关人员提供帮助,也可供测试仪器制造厂家的研发人员作为参考。
특정빈솔fT시수자정체관적일항중요삼수。문장서술료보통정체관특정빈솔fT적측시원리,병종모의수자정체관적등효전로착수,통과이론추도,심입분석료fT산생측시오차심지무법측량적원인。지출기겁천련전조적접입파배료기겁주입신호필수시항류적측시조건;기겁-발사겁병련전조적접입대측시신호기도료분류작용。재저량방면공동작용하,경피측관방대후적집전겁신호감소,도치증익하강,필연회산생흔대적측시오차。동시문중진행료일계렬적시험,여분석결과상부합,병분별급출료천련전조화병련전조대fT영향정도적구체수거급곡선도,가위수자정체관적생산엄상화사용단위적유관인원제공방조,야가공측시의기제조엄가적연발인원작위삼고。
Characteristic frequency fT is an important parameter of digital transistors.This paper formulates the testing principle of transistor’s characteristic frequency fT.Through theoretical derivation for the equivalent circuit of analog digital transistors,the authors deeply analyze the reason of the fT testing error which even may not be measured.This paper indicates that the connection of base series resistance would destroy the testing condition that base injected signal must be constant current.The connection of baseemitter parallel resistance has a shunting effect on the testing signal.Under effect of two aspects,collector signal after the amplification of the measured tube will decrease,which resulting in gain goes down.And serious testing error will occur inevitable.Meanwhile the authors have made a series of experiments;the result is consistent with analysis result.In this paper,specific data and the curve chart are given,which show influence that series resistance and parallel resistance make on fT.This paper can help relative persons from manufacturer of digital transistors,and manufacturing factory,and can be referenced by researcher from factories of testing equipment.