CAJ | 학술논문

随着支持IEEE1149．1标准的边界扫描芯片的广泛应用，传统的电路板测试方法如使用万用表、示波器“探针”，已不能满足板级测试的需求．相反一种基于板级测试的边界扫描技术得到了迅速发展。对边界扫描测试技术的原理进行了剖析．根据边界扫描测试系统的使用规则对板级测试方法进行了分析、提出了整体测试流程，最后在通用测试的基础上进行了二次开发．提出了提高电路板测试覆盖率的方法。
수착지지IEEE1149．1표준적변계소묘심편적엄범응용，전통적전로판측시방법여사용만용표、시파기“탐침”，이불능만족판급측시적수구．상반일충기우판급측시적변계소묘기술득도료신속발전。대변계소묘측시기술적원리진행료부석．근거변계소묘측시계통적사용규칙대판급측시방법진행료분석、제출료정체측시류정，최후재통용측시적기출상진행료이차개발．제출료제고전로판측시복개솔적방법。
With the support of IEEE 1149.1 standard boundary-scan chips widely used,the traditional method of circuit board test can not meet the needs of board-level testing,for example,using a muhimeter, oscilloscope ＂Probe＂ . On the contrary,a based on board-level boundary-scan testing technique has been developed rapidly.The article analyzed the principle of boundary-scan testing technology, According to the rules of the boundary-scan testing system, the article analyzed the method of board-level testing,raised the overall testing process.Finally, a secondary development was considered on the basis of universal testing,the method of improving the circuit board testing coverage was proposed.